Abstract

A method for altering a resistance of a resistor including trimming the resistor using a first type of trim approach to increase a resistance measurement of the resistor to above a target resistance value, and iteratively trimming the resistor using a second type of trim approach until a power coefficient of resistance (PCR) or temperature …

Legal parties

Party
Inventors (applicants): Neville Craig, Patrick Elebert, Fergus John Downey, Patrick McGuinness
Assignees (initial): Analog Devices, Inc. (Norwood, US)
Agents: Kenyon & Kenyon, LLP (attorney)

The application was examined by Kyung Lee (USPTO dept. 2833)

Claims

  • 1. A method for altering an absolute resistance of a resistor, comprising: …
  • 2. The method of claim 1 , further comprising: …
  • 3. The method of claim 2 , wherein the first type of trim approach is laser …

Cited documents

Patents

  • Coolbaugh et al. US 7239006 B2, Jul. 1, 2007
  • Spraggins et al. US 5635893 A, Jun. 1, 1997
  • Hsu US 7084691 B2, Aug. 1, 2006
  • Vyne US 4606781 A, Aug. 1, 1986
  • WO 2005/004207, Jan. 1, 2005
  • Chapel et al. US 4901052 A / 338/308, Feb. 1, 1990
  • Wohlfarth et al. US 5015989 A, May. 1, 1991
  • Hashimoto et al. US 6636143 B1, Oct. 1, 2003
  • Privitera et al. US 2012/0001679 A1, Jan. 1, 2012
  • Downey et al. US 2012/0098593 A1, Apr. 1, 2012
  • Amemiya et al. US 4210996 A, Jul. 1, 1980
  • WO 86/02492 A1, Apr. 1, 1986
  • Audy US 6246243 B1, Jun. 1, 2001
  • SU 1 092 576 A1, May. 1, 1984
  • WO 91/13448 A1, Sep. 1, 1991
  • Praria US 4505032 A, Mar. 1, 1985
  • EP 0 033 155 A1, Aug. 1, 1981
  • David et al. US 4713680 A, Dec. 1, 1987
  • Ireland et al. US 3603768 A, Sep. 1, 1971
  • Landsberger et al. US 7119656 B2, Oct. 1, 2006
  • SU 834 784 A1, May. 1, 1981
  • Brennan et al. US 2006/0028894 A1, Feb. 1, 2006
  • Komatsu US 4467312 A, Aug. 1, 1984
  • McGuiness et al. US 7598841 B2, Oct. 1, 2009
  • JP 06-084621, Mar. 1, 1994
  • Grudin et al. US 2010/0101077 A1, Apr. 1, 2010
  • Naumov et al. US 2005/0062583 A1, Mar. 1, 2005
  • Doyle US 2005/0001241 A1, Jan. 1, 2005
  • McGuiness et al. US 7719403 B2, May. 1, 2010
  • Di Mino et al. US 4714911 A / 338/195, Dec. 1, 1987

Drawings

Brief Description of the Drawings

FIG. 1 illustrates a resistance-over-power curve of a resistor without trimming. FIG. 2 illustrates a comparison of resistance-over-power curves of trimmed and untrimmed resistors. …

Description

Cross-Reference to Related Application

The present application claims priority from U.S. Provisional Application No. 61/622,297 filed on Apr. 10, …

Detailed Description of Example Embodiments

Current trim (ITrim) may be used to trim a resistor so that the resistance of the resistor may stay substantially constant when electric power is applied to the resistor. ITrim …

More details about Method for Altering Electrical and Thermal Properties of Resistive Materials

Miscellaneous patent data

The invention description is illustrated by 4 drawings, the invention is named Method for Altering Electrical and Thermal Properties of Resistive Materials, the protection scope is defined by 19 claims, assigned to a United States company, numbered 13/553,894 (application), particularly claims a method for altering an absolute resistance of a resistor, comprising…, the grant number is 08723637, the inventor's first name is Neville, and his last name is Craig, the exemplary patent drawings are resistance curve of combining two types, Method for Altering Electrical and Thermal, comparison of resistance-over-power curves of trimmed, resistance-over-power curve of a resistor, the claim number 1 is selected as exemplary, the application was examined by Kyung Lee (2833 USPTO department), similar categories include Cooling, heating, or ventilating arrangements, Coherers or like imperfect resistors for detecting electromagnetic waves, wound on cylindrical or prismatic base, screw-operated, Liquid resistance element or contact, Coarse and fine resistance elements, Indirectly heated, Casing or housing formed in plural layers external to element, Ventilated helical or zigzag element, using forced fluid flow, the application publication date is Jul. 20, 2012, categorized under Resistance value varied by removing or adding material as a primary classification, the known agent's organization is Kenyon & Kenyon, LLP, developed by Fergus John Downey et al., the assignee location is Norwood (US); its company is Analog Devices, Inc., the grant date is May. 13, 2014 (publication date), 4 figures are supplied with the description, the published applicant's name is Downey Fergus John.

Invention classification information

The invention is classified under Resistance value varied by removing or adding material, Adjustable resistors. The designated search classifications include Resistance value varied by removing or adding material.

Patent details
Publication number 08723637
Publication date May. 13, 2014
Kind code B2
Application number 13/553,894
Application date Jul. 20, 2012
Application type U
Application series code 13
National classification 338/195
Total number of claims 19
Exemplary claims 1
Number of drawings 4
Number of figures 4
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