Abstract

An apparatus for demodulating an input signal that includes a frequency detector for tracking a frequency of the input signal, an oscillator and a mixer is disclosed. The input signal and an output signal of the oscillator can constitute the incoming signals for the mixer and the output signal of the mixer can constitute the demodulated …

Legal parties

Party
Inventors (applicants): Stefan Koch, Sadik Hafizovic, Niels Haandbaek, Flavio Heer
Assignees (initial): Zurich Instruments AG CH
Agents: Ostrolenk Faber LLP (attorney)

The application was examined by Arnold Kinkead (USPTO dept. 2843)

Claims

  • 1. An apparatus for demodulating an input signal, the apparatus comprising: …
  • 2. The apparatus according to claim 1 , wherein a low-pass filter is arranged downstream …
  • 3. The apparatus according to claim 1 , wherein the tracked frequency of the input …

Cited documents

Patents

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Brief Description of the Drawings

Further advantageous features and applications of the invention can be found in the depending claims as well as in the following description of the drawings illustrating the invention. In the drawings …

Description

Cross-Reference to Related Application

The present application is a 35 U.S.C. §§371 national phase conversion of PCT/CH2010/000066, filed Mar. 10, 2010, the content of which is incorporated herein by reference. The PCT International Application …

Modes for Carrying Out the Invention

FIG. 3 shows a first preferred embodiment 300 of an apparatus according to the invention. The apparatus 300 comprises a frequency detector 302 for detecting a frequency f2, in particular …

More details about Apparatus and Method for Demodulating an Input Signal

Miscellaneous patent data

Claims 1-12 comprise the invention scope, the grant publication date is Sep. 23, 2014, assigned to a foreign company or corporation, numbered 13/578,421 (application), the term of the patent grant was extended by 55 days, the application publication date is Mar. 10, 2010, the grant publication number is 08841964, was examined by Arnold Kinkead, the main examiner (2843 USPTO department), the published inventor's name is Haandbaek Niels, the invention is titled Apparatus and Method for Demodulating an Input Signal, the applicant's last name is Haandbaek, and his first name is Niels, the invention details are shown in 9 figures, the published assignee company name is Zurich Instruments AG, the patent is illustrated by 8 drawings, developed by Sadik Hafizovic et al., particularly claims an apparatus for demodulating an input signal, the apparatus comprising…, similar documents are classified under Modifications of demodulators to reject or remove amplitude variations by means of locked-in oscillator circuits, Circuits for comparing the phase or frequency of two mutually-independent oscillations, means of non-linear elements having more than two poles, Including three or more terminal discrete semiconductor device, Transference of modulation using distributed inductance and capacitance, Balanced arrangements, Including LC resonant phase shift circuit, means of transit-time tubes, means of transit-time tubes, means of electromechanical devices, Including discrete semiconductor device, Modifications of demodulators to reduce distortion, e.g. by negative feedback, Having specific distortion, noise or other interference prevention, reduction or compensation, Including phase or frequency locked loop, means of diodes, e.g. Foster-Seeley discriminator, the agent - Ostrolenk Faber LLP, the claim number 1 is selected as exemplary, the primary classification Input signal split into plural signals has been designated to the document, includes the following drawings: Apparatus and Method for Demodulating, schematic representation of a first, schematic representation of a further, schematic representation of an apparatus.

Invention classification information

The invention is classified under Auxiliary Means Serving to Assist or Improve the Scanning Probe Techniques or Apparatus, e.g., Display or Data Processing Devices, Phase Shift Keying or Quadrature Amplitude Demodulator, Roughness, Input signal split into plural signals, Particular Type of Scanning Probe Microscopy or Microscope; Essential Components Thereof, Testing Potential in Specific Environment, by counting or integrating cycles of oscillations, Homodyne or synchrodyne circuits, Inspection of Solids or Liquids by Charged Particles, Multisensor for both angular rate and linear acceleration, Demodulation of angle-modulated oscillations, With frequency signal response, change or processing circuit. The designated search classifications include Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor, Essential components thereof, Multisensor for both angular rate and linear acceleration, Input signal split into plural signals, With frequency signal response, change or processing circuit, Phase Shift Keying or Quadrature Amplitude Demodulator, Auxiliary Means Serving to Assist or Improve the Scanning Probe Techniques or Apparatus, e.g., Display or Data Processing Devices, Testing Potential in Specific Environment, Arrangements for focusing or reflecting ray or beam, Inspection of Solids or Liquids by Charged Particles, Particular Type of Scanning Probe Microscopy or Microscope; Essential Components Thereof, Modifications of demodulators to reject or remove amplitude variations by means of locked-in oscillator circuits, Roughness.

Patent details
Publication number 08841964
Publication date Sep. 23, 2014
Kind code B2
Application number 13/578,421
Application date Mar. 10, 2010
Application type U
Application series code 13
Int. pub. country WO
Int. pub. number WO2011/109913
Int. publication Sep. 15, 2011
Int. filing country WO
Int. filing PCT/CH2010/000066
Filed internationally Mar. 10, 2010
National stage date Aug. 10, 2012
Extension term 55
National classification 329/327
Total number of claims 12
Exemplary claims 1
Number of drawings 8
Number of figures 9
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