Featured patents

Potential Measurement Device and Atomic Force Microscope
US 08839461 B2, Sept. 16, 2014, Scanning potential microscopy, Naritaka Kobayashi et al. / National University Corporation Kanazawa University (Ishikawa, JP)
A potential measurement device for measuring a surface potential of a sample,…

Device Comprising a Cantilever and Scanning System
US 08819860 B2, Aug. 26, 2014, General Aspects of Spm Probes, Their Manufacture, or Their Related Instrumentation, Insofar as They Are Not Specially Adapted to a Single Specific Spm Technique, Charalampos Pozidis et al. / International Business Machines Corporation (Armonk, US)
A device, comprising:…

Measurement of the Surface Potential of a Material
US 08763160 B2, June 24, 2014, Circuits or algorithms therefor(EPO), Heinrich Diesinger et al. / Centre National de la Recherche Scientifique—CNRS (Paris, FR)
A method for measuring a surface potential of a portion of material, wherein…

High Resolution AFM Tips Containing an Aluminum-Doped Semiconductor Nanowire
US 08683611 B2, March 25, 2014, Nanotube tips, Brent A. Wacaser et al. / International Business Machines Corporation (Armonk, US)
A high resolution AFM tip comprising:…

Coupled Mass-Spring Systems and Imaging Methods for Scanning Probe Microscopy
US 08646111 B2, Feb. 4, 2014, Auxiliary Means Serving to Assist or Improve the Scanning Probe Techniques or Apparatus, e.g., Display or Data Processing Devices, Kimberly L. Turner et al. / The Regents of the University of California (Oakland, US)
A coupled mass-spring system for use as a scanning probe microscope, comprising:…

Method and Apparatus for Micromachines, Microstructures, Nanomachines and Nanostructures
US 08631511 B2, Jan. 14, 2014, Probe holders, Victor B. Kley
A cantilever assembly suitable for use in a scanning probe microscope (SPM),…

Controlling Atomic Force Microscope Using Optical Imaging
US 08595859 B1, Nov. 26, 2013, By optical means, Asger Iversen et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method for optically controlling an atomic force microscope (AFM), the method…

Planar Positioning Device and Inspection Device Provided With the Same
US 08495761 B2, July 23, 2013, Auxiliary Means Serving to Assist or Improve the Scanning Probe Techniques or Apparatus, e.g., Display or Data Processing Devices, Shigeki Mori et al. / Akita Prefecture (Akita-shi, JP)
A planar positioning device comprising:…

Micro/Nano Devices Fabricated From Cu-Hf Thin Films
US 08458811 B2, June 4, 2013, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Christopher Harrower et al. / The Governors of the University of Alberta (Edmonton, Alberta, CA)
An all-metal microdevice or nanodevice comprising a copper-hafnium alloy thin…

Scanning Thermal Twisting Atomic Force Microscopy
US 08458810 B2, June 4, 2013, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Michael E. McConney
An atomic force microscope probe comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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