Featured patents

Force Feedback Leveling of Tip Arrays for Nanolithography
US 08745761 B2, June 3, 2014, Probe tip arrays, Adam B. Braunschweig et al. / Northwestern University (Evanston, US)
A method of leveling a pen array, comprising:…

Atomic Force Microscopy System and Method for Nanoscale Measurement
US 08726410 B2, May 13, 2014, Magnetic Force Microscopy or apparatus therefor, e.g., MFM probes, Vijayaraghava Nalladega et al. / The United States of America as represented by the Secretary of the Air Force (Washington, US)
A method of using an atomic force microscope system to image at least one…

Method and Apparatus of Operating a Scanning Probe Microscope
US 08646109 B2, Feb. 4, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Yan Hu et al. / Bruker Nano, Inc. (Santa Barbara, US)
A method of operating a scanning probe microscope (SPM) comprising:…

Method for Attaching a Particle to a Scanning Probe Tip Through Eutectic Bonding
US 08656511 B2, Feb. 18, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, Hui Wen Cheng et al. / National Tsing Hua University (Hsinchu, TW)
A method for attaching a conductive particle to the apex of the probe tip…

Magnetic Sensor and Scanning Microscope
US 08631510 B2, Jan. 14, 2014, Magnetic Force Microscopy or apparatus therefor, e.g., MFM probes, Adarsh Sandhu / Empire Technology Development LLC (Wilmington, US)
A magnetic sensor comprising:…

Method and Apparatus for Micromachines, Microstructures, Nanomachines and Nanostructures
US 08631511 B2, Jan. 14, 2014, Probe holders, Victor B. Kley
A cantilever assembly suitable for use in a scanning probe microscope (SPM),…

Method of Measuring Vibration Characteristics of Cantilever
US 08615811 B2, Dec. 24, 2013, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Yoshiteru Shikakura et al. / SII NanoTechnology Inc. JP
A method of measuring vibration characteristics of a cantilever in a scanning…

Atomic Force Microscope Probe
US 08516611 B1, Aug. 20, 2013, Conductive probes, Yang Wei et al. / Tsinghua University (Beijing, CN)
An atomic force microscope probe comprising:…

Thermochemical Nanolithography Components, Systems, and Methods
US 08468611 B2, June 18, 2013, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Walt A. de Heer et al. / Georgia Tech Research Corporation (Atlanta, US)
A method of modifying a surface, the method comprising: providing a surface…

Scanning Thermal Twisting Atomic Force Microscopy
US 08458810 B2, June 4, 2013, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Michael E. McConney
An atomic force microscope probe comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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