Featured patents

Apparatus and Method for Analyzing and Modifying a Specimen Surface
US 08769709 B2, July 1, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Thorsten Hofmann et al. / Carl Zeiss SMS GmbH (Jena, DE)
A probe assembly, comprising:…

In-Liquid Potential Measurement Device and Atomic Force Microscope
US 08695108 B2, April 8, 2014, Calibration Aspect, e.g., Calibration of Probes, Fukuma Takeshi et al. / National University Corporation Kanazawa University (Kanazawa-shi, Ishikawa, JP)
An in-liquid potential measurement device that measures a surface potential…

Dynamic Mode Nano-Scale Imaging and Position Control Using Deflection Signal Direct Sampling of Higher Mode-Actuated Microcantilevers
US 08689358 B2, April 1, 2014, Circuits or algorithms therefor(EPO), Venkataraman Kartik et al. / International Business Machines Corporation (Armonk, US)
An apparatus, comprising:…

System, Apparatus, and Method for Simultaneous Single Molecule Atomic Force Microscopy and Fluorescence Measurements
US 08656510 B1, Feb. 18, 2014, Non-SPM analyzing devices, e.g., Scanning Electron Microscope, spectrometer or optical microscope, Hui Li et al. / Iowa State University Research Foundation, Inc. (Ames, US)
An integrated system for simultaneous AFM and fluorescence measurements…

Probe Shape Evaluation Method for a Scanning Probe Microscope
US 08621660 B2, Dec. 31, 2013, Shape or taper, Masafumi Watanabe et al. / Hitachi High-Tech Science Corporation JP
A probe shape evaluation method of measuring a tip shape of a probe by a scanning…

Optical Electric Field Enhancement Element and Probe Using the Same
US 08601610 B2, Dec. 3, 2013, Probe manufacture, Masakazu Aono et al. / Japan Science and Technology Agency (Saitama, JP)
A probe for Raman scattering spectroscopy, the probe comprising:…

High-Frequency Rheology System
US 08516610 B1, Aug. 20, 2013, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Christine Ortiz et al. / Massachusetts Institute of Technology (Cambridge, US)
A rheology system comprising:…

Cantilever Excitation Device and Scanning Probe Microscope
US 08505111 B2, Aug. 6, 2013, With compensation for temperature or vibration induced errors, Takeshi Fukuma et al. / National University Corporation Kanazawa University (Ishikawa, JP)
A cantilever excitation device for exciting vibration of a cantilever,…

Probe Aligning Method for Probe Microscope and Probe Microscope Operated by the Same
US 08495759 B2, July 23, 2013, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Shigeru Wakiyama et al. / SII NanoTechnology Inc. (Chiba, JP)
A probe aligning method for a probe microscope comprising:…

Scanning Probe Microscope With Compact Scanner
US 08474060 B2, June 25, 2013, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Jeff Markakis et al. / Bruker Nano, Inc. (Santa Barbara, US)
A scanner for a scanning probe microscope (SPM) including a head, the scanner…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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