Featured patents

Probe Alignment Tool for the Scanning Probe Microscope
US 08832859 B2, Sept. 9, 2014, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Ali R. Afshari
A probe alignment tool for the scanning probe microscope, comprising: a relay…

Method for Examining a Measurement Object, and Apparatus
US 08769711 B2, July 1, 2014, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Torsten Jähnke / JPK Instruments AG (Berlin, DE)
A method for examining a sample, said method comprising the steps of:…

Method to Reduce Wedge Effects in Molded Trigonal Tips
US 08701211 B2, April 15, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, Nicolae Moldovan / Advanced Diamond Technologies, Inc. (Romeoville, US)
A method comprising:…

High Resolution AFM Tips Containing an Aluminum-Doped Semiconductor Nanowire
US 08683611 B2, March 25, 2014, Nanotube tips, Brent A. Wacaser et al. / International Business Machines Corporation (Armonk, US)
A high resolution AFM tip comprising:…

Microcantilever Microwave Probe
US 08661560 B1, Feb. 25, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, Xinxin Li et al. / PrimeNano, Inc. (Palo Alto, US)
An electrical probe, comprising:…

Electrical-Mechanical Complex Sensor for Nanomaterials
US 08621661 B2, Dec. 31, 2013, Applications of Scanning-Probe Techniques Other Than Spm, Min Seok Kim et al. / Korea Research Institute of Standards and Science (Daejeon, KR)
An electrical-mechanical complex sensor for nanomaterials, comprising:…

Electronic Control and Amplification Device for a Local Piezoelectric Force Measurement Probe Under a Particle Beam
US 08627511 B2, Jan. 7, 2014, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Jerome Polesel / Commissariat a l'energie atomique et aux energies alternatives (Paris, FR)
An electronic control device for a local probe with a piezoelectric resonator…

Thermal Probe
US 08578511 B2, Nov. 5, 2013, Probe characteristics, Fang-Yi Liao et al. / National Cheng Kung University (Tainan, TW)
A thermal probe, comprising:…

Prototyping Station for Atomic Force Microscope-Assisted Deposition of Nanostructures
US 08499361 B2, July 30, 2013, Particular Type of Scanning Probe Microscopy or Microscope; Essential Components Thereof, Timothy P. Holme et al. / The Board of Trustees of the Leland Stanford Junior University (Palo Alto, US)
A scanning probe microscope (SPM) isolation device, comprising a chamber divided…

Contact Type Plasmonic Nano Optical Probe, Parallel Probe Constituted of the Same, Plasmonic Optical Apparatus Including the Parallel Probe, and a Method of Fabricating the Parallel Probe
US 08490210 B2, July 16, 2013, Scanning Near-Field Optical Microscopy or apparatus therefor, e.g., SNOM probes, Jae Won Hahn / Industry-Academic Cooperation Foundation, Yonsei University (Seoul, KR)
An optical apparatus, comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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