Featured patents

Scanning Probe Microscopy Cantilever Comprising an Electromagnetic Sensor
US 08875311 B2, Oct. 28, 2014, By optical means, Philip Paul et al. / International Business Machines Corporation (Armonk, US)
A scanning probe microscopy cantilever, comprising:…

Method for Examining a Measurement Object, and Apparatus
US 08769711 B2, July 1, 2014, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Torsten Jähnke / JPK Instruments AG (Berlin, DE)
A method for examining a sample, said method comprising the steps of:…

Image Force Microscopy of Molecular Resonance
US 08739311 B2, May 27, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, H. Kumar Wickramasinghe et al.
An atomic force microscope based apparatus comprising:…

Probe Head Scanning Probe Microscope Including the Same
US 08689360 B2, April 1, 2014, Multiple-type SPM, i.e., involving two or more SPM techniques, In-su Jeon / Samsung Electronics Co., Ltd. (Suwon-si, KR)
A probe holder comprising:…

Cantilever for Scanning Probe Microscope and Scanning Probe Microscope Equipped With It
US 08601608 B2, Dec. 3, 2013, Probes, their manufacture, or their related instrumentation, e.g., holders, Kenichi Maruyama et al. / Japan Science and Technology Agency (Kawaguchi-shi, JP)
A cantilever for a scanning probe microscope, said cantilever comprising:…

Method of Determining a Spring Constant of a Cantilever and Scanning Probe Microscope Using the Method
US 08584261 B2, Nov. 12, 2013, Probe manufacture, Hiroumi Momota et al. / SII Nanotechnology Inc. (Chiba, JP)
A method of manufacturing a cantilever for use in a scanning probe microscope,…

Measuring Probe Device for a Probe Microscope, Measuring Cell and Scanning Probe Microscope
US 08505109 B2, Aug. 6, 2013, Liquid environment, Kathryn Anne Poole et al. / JPK Instruments AG (Berlin, DE)
A measuring probe device for a probe microscope, in particular a scanning probe…

Tip-Mounted Nanowire Light Source Instrumentation
US 08484756 B2, July 9, 2013, Probes, their manufacture, or their related instrumentation, e.g., holders, Norman A. Sanford et al. / The United States of America, as represented by the Secretary of Commerce, the National Institute of Standards and Technology (Washington, US)
A scanning probe microscopy instrument comprising:…

Mode Synthesizing Atomic Force Microscopy and Mode-Synthesizing Sensing
US 08448261 B2, May 21, 2013, AC mode, Thomas George Thundat et al. / University of Tennessee Research Foundation (Knoxville, US)
An analysis system comprising:…

Scanning Thermal Twisting Atomic Force Microscopy
US 08458810 B2, June 4, 2013, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Michael E. McConney
An atomic force microscope probe comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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