Featured patents

Scanning Probe Microscope
US 08844061 B2, Sept. 23, 2014, Adhesion force microscopy, Shuichi Baba et al. / HITACHI, Ltd. (Tokyo, JP)
A scanning probe microscope for scanning a sample surface with a probe formed…

Apparatus and Method for Analyzing and Modifying a Specimen Surface
US 08769709 B2, July 1, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Thorsten Hofmann et al. / Carl Zeiss SMS GmbH (Jena, DE)
A probe assembly, comprising:…

High Resolution AFM Tips Containing an Aluminum-Doped Semiconductor Nanowire
US 08683611 B2, March 25, 2014, Nanotube tips, Brent A. Wacaser et al. / International Business Machines Corporation (Armonk, US)
A high resolution AFM tip comprising:…

Apparatus for Charged Particle Lithography System
US 08677511 B2, March 18, 2014, By optical means, Shih-Chi Wang et al. / Taiwan Semiconductor Manufacturing Company, Ltd. (Hsin-Chu, TW)
An apparatus for leveling a substrate in a charged particle lithography system,…

Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample
US 08650660 B2, Feb. 11, 2014, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Ji Ma et al. / Bruker Nano, Inc. (Santa Barbara, US)
A method of operating a scanning probe microscope (SPM) comprising:…

Electrical-Mechanical Complex Sensor for Nanomaterials
US 08621661 B2, Dec. 31, 2013, Applications of Scanning-Probe Techniques Other Than Spm, Min Seok Kim et al. / Korea Research Institute of Standards and Science (Daejeon, KR)
An electrical-mechanical complex sensor for nanomaterials, comprising:…

High-Frequency Rheology System
US 08516610 B1, Aug. 20, 2013, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Christine Ortiz et al. / Massachusetts Institute of Technology (Cambridge, US)
A rheology system comprising:…

Method for Positioning an Atomic Force Microscopy Tip in a Cell
US 08528111 B2, Sept. 3, 2013, Non-SPM analyzing devices, e.g., Scanning Electron Microscope, spectrometer or optical microscope, Nazumi Alice Yamada et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method for positioning a tip of an atomic force microscope relative…

Surface State Measuring Device, and Surface State Measuring Method Using the Device
US 08490209 B2, July 16, 2013, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Hitoshi Saito / Akita University (Akita-shi, JP)
A surface state measuring device for measuring surface state of a sample by…

Contact Type Plasmonic Nano Optical Probe, Parallel Probe Constituted of the Same, Plasmonic Optical Apparatus Including the Parallel Probe, and a Method of Fabricating the Parallel Probe
US 08490210 B2, July 16, 2013, Scanning Near-Field Optical Microscopy or apparatus therefor, e.g., SNOM probes, Jae Won Hahn / Industry-Academic Cooperation Foundation, Yonsei University (Seoul, KR)
An optical apparatus, comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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