Featured patents

Low Drift Scanning Probe Microscope
US 08869310 B2, Oct. 21, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Henry Mittel et al. / Bruker Nano, Inc. (Santa Barbara, US)
An atomic force microscope comprising:…

Tool Tips With Scanning Probe Microscopy And/Or Atomic Force Microscopy Applications
US 08776261 B2, July 8, 2014, By optical means, Victor B. Kley
An SPM tip assembly including:…

Image Force Microscopy of Molecular Resonance
US 08739311 B2, May 27, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, H. Kumar Wickramasinghe et al.
An atomic force microscope based apparatus comprising:…

Method and Apparatus of Operating a Scanning Probe Microscope
US 08646109 B2, Feb. 4, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Yan Hu et al. / Bruker Nano, Inc. (Santa Barbara, US)
A method of operating a scanning probe microscope (SPM) comprising:…

Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample
US 08650660 B2, Feb. 11, 2014, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Ji Ma et al. / Bruker Nano, Inc. (Santa Barbara, US)
A method of operating a scanning probe microscope (SPM) comprising:…

Optical Electric Field Enhancement Element and Probe Using the Same
US 08601610 B2, Dec. 3, 2013, Probe manufacture, Masakazu Aono et al. / Japan Science and Technology Agency (Saitama, JP)
A probe for Raman scattering spectroscopy, the probe comprising:…

Controlling Atomic Force Microscope Using Optical Imaging
US 08595859 B1, Nov. 26, 2013, By optical means, Asger Iversen et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method for optically controlling an atomic force microscope (AFM), the method…

Method for Positioning an Atomic Force Microscopy Tip in a Cell
US 08528111 B2, Sept. 3, 2013, Non-SPM analyzing devices, e.g., Scanning Electron Microscope, spectrometer or optical microscope, Nazumi Alice Yamada et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method for positioning a tip of an atomic force microscope relative…

Apparatus and Method for the Functionalisation of AFM Tips
US 08484758 B2, July 9, 2013, Functionalization, Isabel Garcia Martin et al. / Centro de Investigacion Cooperativa en Biomateriales (CIC Biomagune) (San Sebastian, ES
An apparatus comprising:…

Dynamic Probe Detection System
US 08479310 B2, July 2, 2013, Scanning Tunnelling Microscopy or apparatus therefor, e.g., STM probes, Andrew Humphris / Infinitesima Ltd. (Oxfordshire, GB)
A detection system for use with a scanning probe microscope, the system…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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