Featured patents

Device Comprising a Cantilever and Scanning System
US 08819860 B2, Aug. 26, 2014, General Aspects of Spm Probes, Their Manufacture, or Their Related Instrumentation, Insofar as They Are Not Specially Adapted to a Single Specific Spm Technique, Charalampos Pozidis et al. / International Business Machines Corporation (Armonk, US)
A device, comprising:…

Radio-Frequency Reflectometry Scanning Tunneling Microscope
US 08863311 B1, Oct. 14, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, I-Jan Chen et al. / National Taiwan University (Taipei, TW)
A radio-frequency (RF) reflectometry scanning tunneling microscope suitable…

Scanning Probe Microscope Having Support Stage Incorporating a Kinematic Flexure Arrangement
US 08782810 B2, July 15, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Carl Masser / Bruker Nano, Inc. (Santa Barbara, US)
A scanning probe microscope (SPM) comprising:…

Cantilever of Scanning Probe Microscope and Method for Manufacturing the Same, Method for Inspecting Thermal Assist Type Magnetic Head Device and Its Apparatus
US 08713710 B2, April 29, 2014, Probes with magnetic coating, Kaifeng Zhang et al. / Hitachi High-Technologies Corporation (Tokyo, JP)
An inspection apparatus for inspecting a thermal assist type magnetic head…

Method of Making Thin Film Probe Tip for Atomic Force Microscopy
US 08689361 B1, April 1, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, Salleh Ismail / Oicmicro, LLC (Temple City, US)
A method of producing a thin film probe for atomic force microscopy, comprising:…

Method and Apparatus for Measuring Cantilever Deflection in Constrained Spaces
US 08667611 B2, March 4, 2014, By optical means, Aleksander Labuda et al. / The Royal Institution for the Advancement of Learning/McGill University (Montreal, CA)
A method comprising:…

Method for Attaching a Particle to a Scanning Probe Tip Through Eutectic Bonding
US 08656511 B2, Feb. 18, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, Hui Wen Cheng et al. / National Tsing Hua University (Hsinchu, TW)
A method for attaching a conductive particle to the apex of the probe tip…

Scanning Probe Microscope and Surface Shape Measuring Method Using Same
US 08656509 B2, Feb. 18, 2014, Fine scanning or positioning, Toshihiko Nakata et al. / Hitachi, Ltd. (Tokyo, JP)
A scanning probe microscope which measures a surface shape of a sample by…

Controlling Atomic Force Microscope Using Optical Imaging
US 08595859 B1, Nov. 26, 2013, By optical means, Asger Iversen et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method for optically controlling an atomic force microscope (AFM), the method…

Scanning Thermal Twisting Atomic Force Microscopy
US 08458810 B2, June 4, 2013, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Michael E. McConney
An atomic force microscope probe comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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