Featured patents

Displacement Detection Mechanism and Scanning Probe Microscope Using the Same
US 08869311 B2, Oct. 21, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Ryusuke Hirose / SII NanoTechnology Inc. JP
A scanning probe microscope, comprising:…

Measurement of the Surface Potential of a Material
US 08763160 B2, June 24, 2014, Circuits or algorithms therefor(EPO), Heinrich Diesinger et al. / Centre National de la Recherche Scientifique—CNRS (Paris, FR)
A method for measuring a surface potential of a portion of material, wherein…

Method for Driving a Scanning Probe Microscope at Elevated Scan Frequencies
US 08726409 B2, May 13, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Friedrich Esch et al. / Consiglio Nazionale Delle Ricerche (Rome, IT)
A method for operating a scanning probe microscope having a probe, adapted to be…

Probe Head Scanning Probe Microscope Including the Same
US 08689360 B2, April 1, 2014, Multiple-type SPM, i.e., involving two or more SPM techniques, In-su Jeon / Samsung Electronics Co., Ltd. (Suwon-si, KR)
A probe holder comprising:…

Thermal Probe
US 08595861 B2, Nov. 26, 2013, Scanning Thermal Microscopy [SThM] or apparatus therefor, e.g., SThM probes, Jian-Hong Chen et al. / National Cheng Kung University (Tainan, TW)
A thermal probe comprising:…

Method of Determining a Spring Constant of a Cantilever and Scanning Probe Microscope Using the Method
US 08584261 B2, Nov. 12, 2013, Probe manufacture, Hiroumi Momota et al. / SII Nanotechnology Inc. (Chiba, JP)
A method of manufacturing a cantilever for use in a scanning probe microscope,…

Method for Positioning an Atomic Force Microscopy Tip in a Cell
US 08528111 B2, Sept. 3, 2013, Non-SPM analyzing devices, e.g., Scanning Electron Microscope, spectrometer or optical microscope, Nazumi Alice Yamada et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method for positioning a tip of an atomic force microscope relative…

Atomic Force Microscopes and Methods of Measuring Specimens Using the Same
US 08499360 B2, July 30, 2013, Fine scanning or positioning, Yonmook Park / Samsung Electronics Co., Ltd (Gyeonggi-do, KR)
An atomic force microscope, comprising:…

Measuring Probe Device for a Probe Microscope, Measuring Cell and Scanning Probe Microscope
US 08505109 B2, Aug. 6, 2013, Liquid environment, Kathryn Anne Poole et al. / JPK Instruments AG (Berlin, DE)
A measuring probe device for a probe microscope, in particular a scanning probe…

Dynamic Probe Detection System
US 08479310 B2, July 2, 2013, Scanning Tunnelling Microscopy or apparatus therefor, e.g., STM probes, Andrew Humphris / Infinitesima Ltd. (Oxfordshire, GB)
A detection system for use with a scanning probe microscope, the system…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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