Featured patents

Near Field Optical Microscope
US 08832861 B2, Sept. 9, 2014, Scanning Near-Field Optical Microscopy or apparatus therefor, e.g., SNOM probes, Nenad Ocelic / Neaspec GmbH (Martinsried, DE)
A device for the near-field optical measurement of a specimen comprising a probe,…

Miniaturized Cantilever Probe for Scanning Probe Microscopy and Fabrication Thereof
US 08756710 B2, June 17, 2014, Probe manufacture, Weijie Wang et al. / Bruker-Nano, Inc. (Santa Barbara, US)
A method for constructing a cantilever for use with a scanning probe microscope…

Atomic Force Microscope System Using Selective Active Damping
US 08769710 B2, July 1, 2014, Circuits or algorithms therefor(EPO), Richard K. Workman et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method of operating an atomic force microscope (AFM) system comprising…

Atomic Force Microscopy System and Method for Nanoscale Measurement
US 08726410 B2, May 13, 2014, Magnetic Force Microscopy or apparatus therefor, e.g., MFM probes, Vijayaraghava Nalladega et al. / The United States of America as represented by the Secretary of the Air Force (Washington, US)
A method of using an atomic force microscope system to image at least one…

In-Liquid Potential Measurement Device and Atomic Force Microscope
US 08695108 B2, April 8, 2014, Calibration Aspect, e.g., Calibration of Probes, Fukuma Takeshi et al. / National University Corporation Kanazawa University (Kanazawa-shi, Ishikawa, JP)
An in-liquid potential measurement device that measures a surface potential…

Method and System for Near-Field Optical Imaging
US 08695109 B2, April 8, 2014, Scanning Near-Field Optical Microscopy or apparatus therefor, e.g., SNOM probes, Alexander A. Govyadinov et al. / The Trustees Of The University Of Pennsylvania (Philadelphia, US)
A method for optical imaging comprising:…

Electronic Control and Amplification Device for a Local Piezoelectric Force Measurement Probe Under a Particle Beam
US 08627511 B2, Jan. 7, 2014, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Jerome Polesel / Commissariat a l'energie atomique et aux energies alternatives (Paris, FR)
An electronic control device for a local probe with a piezoelectric resonator…

Cantilever for Scanning Probe Microscope and Scanning Probe Microscope Equipped With It
US 08601608 B2, Dec. 3, 2013, Probes, their manufacture, or their related instrumentation, e.g., holders, Kenichi Maruyama et al. / Japan Science and Technology Agency (Kawaguchi-shi, JP)
A cantilever for a scanning probe microscope, said cantilever comprising:…

Apparatus for Performing Magnetic Resonance Force Microscopy on Large Area Samples
US 08549661 B2, Oct. 1, 2013, Scanning Ion-Conductance Microscopy or apparatus therefor, e.g., SICM probes(EPO), Doran Smith / The United States of America as represented by the Secretary of the Army (Washington, US)
An apparatus for performing magnetic resonance force microscopy on one or more…

Spatially Resolved Quantitative Mapping of Thermomechanical Properties and Phase Transition Temperatures Using Scanning Probe Microscopy
US 08484759 B2, July 9, 2013, Scanning Thermal Microscopy [SThM] or apparatus therefor, e.g., SThM probes, Stephen Jesse et al. / UT-Battelle, LLC (Oak Ridge, US)
An apparatus comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

Narrow down the browsing criteria below to see more patents.

Select a subcategory
Quick navigation
New documents
  • Process for the Production of the Actinobacillus Pleuropneumoniae Toxins APXI or APXIII in a Liquid Culture Medium Under Supply of Air Enriched in Carbon Dioxide
  • Method for Manufacturing Nonvolatile Memory Device
  • Supply Chain Demand Satisfaction
  • Supply-Line Management Device
  • Storage Control Device and Method for Managing Snapshot