Featured patents

Apparatus of Analyzing a Sample and a Method for the Same
US 08819859 B1, Aug. 26, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Yuan-Chih Chu et al. / Taiwan Semiconductor Manufacturing Company, Ltd. (Hsin-Chu, TW)
An apparatus comprising:…

Mode-Synthesizing Atomic Force Microscopy and Mode-Synthesizing Sensing
US 08789211 B2, July 22, 2014, AC mode, Ali Passian et al. / UT-Battelle, LLC (OakRidge, US)
A sensor system comprising:…

Cleaning Station for Atomic Force Microscope
US 08782811 B2, July 15, 2014, Scanning-Probe Techniques or Apparatus Not Otherwise Provided For, Daniel Lyons et al. / Bruker Nano, Inc. (Santa Barbara, US)
An apparatus for cleaning a surface of an AFM component comprising:…

Miniaturized Cantilever Probe for Scanning Probe Microscopy and Fabrication Thereof
US 08756710 B2, June 17, 2014, Probe manufacture, Weijie Wang et al. / Bruker-Nano, Inc. (Santa Barbara, US)
A method for constructing a cantilever for use with a scanning probe microscope…

Tool Tips With Scanning Probe Microscopy And/Or Atomic Force Microscopy Applications
US 08776261 B2, July 8, 2014, By optical means, Victor B. Kley
An SPM tip assembly including:…

Method for Driving a Scanning Probe Microscope at Elevated Scan Frequencies
US 08726409 B2, May 13, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Friedrich Esch et al. / Consiglio Nazionale Delle Ricerche (Rome, IT)
A method for operating a scanning probe microscope having a probe, adapted to be…

Optimal Excitation Force Design Indentation-Based Rapid Broadband Nanomechanical Spectroscopy
US 08590061 B1, Nov. 19, 2013, Circuits or algorithms therefor(EPO), Zhonghua Xu et al. / Iowa State University Research Foundation, Inc. (Ames, US)
A method of determining an optimal input force to be applied to a scanning…

Planar Positioning Device and Inspection Device Provided With the Same
US 08495761 B2, July 23, 2013, Auxiliary Means Serving to Assist or Improve the Scanning Probe Techniques or Apparatus, e.g., Display or Data Processing Devices, Shigeki Mori et al. / Akita Prefecture (Akita-shi, JP)
A planar positioning device comprising:…

Methods for Referencing Related Magnetic Head Microscopy Scans to Reduce Processing Requirements for High Resolution Imaging
US 08490211 B1, July 16, 2013, Probes with magnetic coating, Sean P. Leary / Western Digital Technologies, Inc. (Irvine, US)
A method for referencing related magnetic head atomic force microscopy scans,…

Device and Method for an Atomic Force Microscope for the Study and Modification of Surface Properties
US 08479311 B2, July 2, 2013, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Ivo W. Rangelow et al. / Technische Universitat Ilmenau DE
An atomic force microscope (AFM) device for studying and/or modifying a material…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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