Featured patents

Near Field Optical Microscope
US 08832861 B2, Sept. 9, 2014, Scanning Near-Field Optical Microscopy or apparatus therefor, e.g., SNOM probes, Nenad Ocelic / Neaspec GmbH (Martinsried, DE)
A device for the near-field optical measurement of a specimen comprising a probe,…

Control System for a Scanning Probe Microscope
US 08732861 B2, May 20, 2014, Display or data processing devices, Andrew Humphris et al. / Infinitesima Ltd. (Oxfordshire, GB)
A control system for use with a scanning probe microscope of a type…

Cantilever, Cantilever System, and Probe Microscope and Adsorption Mass Sensor Including the Cantilever System
US 08719959 B2, May 6, 2014, Particular Type of Scanning Probe Microscopy or Microscope; Essential Components Thereof, Masatsugu Shigeno / SII Nano Technology Inc. (Chiba, JP)
A cantilever for use in a detecting device which is configured to perform…

Temperature-Dependent Nanoscale Contact Potential Measurement Technique and Device
US 08719960 B2, May 6, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, William P. King / The Board of Trustees of the University of Illinois (Urbana, US)
A device for measuring or controlling temperature-dependent electrical properties…

Video Rate-Enabling Probes for Atomic Force Microscopy
US 08695111 B2, April 8, 2014, Shape or taper, Chung Hoon Lee
A probe, comprising: a)…

Method for Attaching a Particle to a Scanning Probe Tip Through Eutectic Bonding
US 08656511 B2, Feb. 18, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, Hui Wen Cheng et al. / National Tsing Hua University (Hsinchu, TW)
A method for attaching a conductive particle to the apex of the probe tip…

Magnetic Field Observation Device and Magnetic Field Observation Method
US 08621658 B2, Dec. 31, 2013, General Aspects of Spm Probes, Their Manufacture, or Their Related Instrumentation, Insofar as They Are Not Specially Adapted to a Single Specific Spm Technique, Hitoshi Saito et al. / Akita University (Akita, JP)
A magnetic field observation device that observes a stray magnetic field…

Method of Fabricating a Probe Device for a Metrology Instrument and a Probe Device Produced Thereby
US 08595860 B2, Nov. 26, 2013, Probes, their manufacture, or their related instrumentation, e.g., holders, Weijie Wang et al. / Bruker Nano, Inc. (Santa Barbara, US)
A method of producing an atomic force probe for a metrology instrument,…

Apparatus and Process for Controlled Nanomanufacturing Using Catalyst Retaining Structures
US 08505110 B2, Aug. 6, 2013, Probes, their manufacture, or their related instrumentation, e.g., holders, Cattien Nguyen / Eloret Corporation (Sunnyvale, US)
An apparatus for fabricating catalyst retaining structures; comprising:…

Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy in Liquid
US 08479309 B2, July 2, 2013, Auxiliary Means Serving to Assist or Improve the Scanning Probe Techniques or Apparatus, e.g., Display or Data Processing Devices, Majid Minary-Jolandan et al. / The Board of Trustees of the University of Illinois (Urbana, US)
A method of imaging a material submersed in liquid by tapping mode atomic force…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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