Featured patents

Method and Apparatus for Infrared Scattering Scanning Near-Field Optical Microscopy
US 08793811 B1, July 29, 2014, Non-SPM analyzing devices, e.g., Scanning Electron Microscope, spectrometer or optical microscope, Markus B. Raschke et al. / Anasys Instruments (Santa Barbara, US)
A method of obtaining an optical property of a sub micrometer region of a sample…

Method for Examining a Measurement Object, and Apparatus
US 08769711 B2, July 1, 2014, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Torsten Jähnke / JPK Instruments AG (Berlin, DE)
A method for examining a sample, said method comprising the steps of:…

High Resolution AFM Tips Containing an Aluminum-Doped Semiconductor Nanowire
US 08683611 B2, March 25, 2014, Nanotube tips, Brent A. Wacaser et al. / International Business Machines Corporation (Armonk, US)
A high resolution AFM tip comprising:…

Method and Apparatus for Micromachines, Microstructures, Nanomachines and Nanostructures
US 08631511 B2, Jan. 14, 2014, Probe holders, Victor B. Kley
A cantilever assembly suitable for use in a scanning probe microscope (SPM),…

Methods of Preparing Nanoprobes and Endoscope-Like Devices
US 08601611 B2, Dec. 3, 2013, Probe manufacture, Riju Singhal et al. / Drexel University (Philadelphia, US)
A method of preparing a nanoprobe having a handle with an at least partially…

Method for Positioning an Atomic Force Microscopy Tip in a Cell
US 08528111 B2, Sept. 3, 2013, Non-SPM analyzing devices, e.g., Scanning Electron Microscope, spectrometer or optical microscope, Nazumi Alice Yamada et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method for positioning a tip of an atomic force microscope relative…

Probe Aligning Method for Probe Microscope and Probe Microscope Operated by the Same
US 08495759 B2, July 23, 2013, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Shigeru Wakiyama et al. / SII NanoTechnology Inc. (Chiba, JP)
A probe aligning method for a probe microscope comprising:…

Prototyping Station for Atomic Force Microscope-Assisted Deposition of Nanostructures
US 08499361 B2, July 30, 2013, Particular Type of Scanning Probe Microscopy or Microscope; Essential Components Thereof, Timothy P. Holme et al. / The Board of Trustees of the Leland Stanford Junior University (Palo Alto, US)
A scanning probe microscope (SPM) isolation device, comprising a chamber divided…

Thermochemical Nanolithography Components, Systems, and Methods
US 08468611 B2, June 18, 2013, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Walt A. de Heer et al. / Georgia Tech Research Corporation (Atlanta, US)
A method of modifying a surface, the method comprising: providing a surface…

Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy in Liquid
US 08479309 B2, July 2, 2013, Auxiliary Means Serving to Assist or Improve the Scanning Probe Techniques or Apparatus, e.g., Display or Data Processing Devices, Majid Minary-Jolandan et al. / The Board of Trustees of the University of Illinois (Urbana, US)
A method of imaging a material submersed in liquid by tapping mode atomic force…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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