Featured patents

Scanning Probe Microscope
US 08844061 B2, Sept. 23, 2014, Adhesion force microscopy, Shuichi Baba et al. / HITACHI, Ltd. (Tokyo, JP)
A scanning probe microscope for scanning a sample surface with a probe formed…

Method for Examining a Measurement Object, and Apparatus
US 08769711 B2, July 1, 2014, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Torsten Jähnke / JPK Instruments AG (Berlin, DE)
A method for examining a sample, said method comprising the steps of:…

Charged Probe and Electric Fields Measurement Method Thereof
US 08726411 B1, May 13, 2014, Nanotube tips, Fan-Gang Tseng et al. / National Tsing Hua University (Hsinchu, TW)
A charged probe applicable for scanning probe microscopy, comprising:…

In-Liquid Potential Measurement Device and Atomic Force Microscope
US 08695108 B2, April 8, 2014, Calibration Aspect, e.g., Calibration of Probes, Fukuma Takeshi et al. / National University Corporation Kanazawa University (Kanazawa-shi, Ishikawa, JP)
An in-liquid potential measurement device that measures a surface potential…

System, Apparatus, and Method for Simultaneous Single Molecule Atomic Force Microscopy and Fluorescence Measurements
US 08656510 B1, Feb. 18, 2014, Non-SPM analyzing devices, e.g., Scanning Electron Microscope, spectrometer or optical microscope, Hui Li et al. / Iowa State University Research Foundation, Inc. (Ames, US)
An integrated system for simultaneous AFM and fluorescence measurements…

Method and Apparatus for Micromachines, Microstructures, Nanomachines and Nanostructures
US 08631511 B2, Jan. 14, 2014, Probe holders, Victor B. Kley
A cantilever assembly suitable for use in a scanning probe microscope (SPM),…

Apparatus for Performing Magnetic Resonance Force Microscopy on Large Area Samples
US 08549661 B2, Oct. 1, 2013, Scanning Ion-Conductance Microscopy or apparatus therefor, e.g., SICM probes(EPO), Doran Smith / The United States of America as represented by the Secretary of the Army (Washington, US)
An apparatus for performing magnetic resonance force microscopy on one or more…

Planar Positioning Device and Inspection Device Provided With the Same
US 08495761 B2, July 23, 2013, Auxiliary Means Serving to Assist or Improve the Scanning Probe Techniques or Apparatus, e.g., Display or Data Processing Devices, Shigeki Mori et al. / Akita Prefecture (Akita-shi, JP)
A planar positioning device comprising:…

Scanning Probe Microscope With Compact Scanner
US 08474060 B2, June 25, 2013, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Jeff Markakis et al. / Bruker Nano, Inc. (Santa Barbara, US)
A scanner for a scanning probe microscope (SPM) including a head, the scanner…

Thermochemical Nanolithography Components, Systems, and Methods
US 08468611 B2, June 18, 2013, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Walt A. de Heer et al. / Georgia Tech Research Corporation (Atlanta, US)
A method of modifying a surface, the method comprising: providing a surface…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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