Featured patents

Near Field Optical Microscope
US 08832861 B2, Sept. 9, 2014, Scanning Near-Field Optical Microscopy or apparatus therefor, e.g., SNOM probes, Nenad Ocelic / Neaspec GmbH (Martinsried, DE)
A device for the near-field optical measurement of a specimen comprising a probe,…

Cantilever, Cantilever System, and Probe Microscope and Adsorption Mass Sensor Including the Cantilever System
US 08719959 B2, May 6, 2014, Particular Type of Scanning Probe Microscopy or Microscope; Essential Components Thereof, Masatsugu Shigeno / SII Nano Technology Inc. (Chiba, JP)
A cantilever for use in a detecting device which is configured to perform…

Electrical-Mechanical Complex Sensor for Nanomaterials
US 08621661 B2, Dec. 31, 2013, Applications of Scanning-Probe Techniques Other Than Spm, Min Seok Kim et al. / Korea Research Institute of Standards and Science (Daejeon, KR)
An electrical-mechanical complex sensor for nanomaterials, comprising:…

Magnetic Field Observation Device and Magnetic Field Observation Method
US 08621658 B2, Dec. 31, 2013, General Aspects of Spm Probes, Their Manufacture, or Their Related Instrumentation, Insofar as They Are Not Specially Adapted to a Single Specific Spm Technique, Hitoshi Saito et al. / Akita University (Akita, JP)
A magnetic field observation device that observes a stray magnetic field…

Scanning Probe Microscope and Method of Observing Sample Using the Same
US 08635710 B2, Jan. 21, 2014, Scanning Near-field Optical Microscopy combined with Atomic Force Microscopy, Makoto Okai et al. / Hitachi, Ltd. (Tokyo, JP)
A scanning probe microscope comprising:…

Cantilever-Based Optical Fiber Probe Interfacial Force Microscope for Partial Immersion in Liquid
US 08549660 B2, Oct. 1, 2013, Liquid environment, Byung Kim / Boise State University (Boise, US)
An apparatus, comprising:…

Atomic Force Microscope Probe
US 08516611 B1, Aug. 20, 2013, Conductive probes, Yang Wei et al. / Tsinghua University (Beijing, CN)
An atomic force microscope probe comprising:…

Methods for Referencing Related Magnetic Head Microscopy Scans to Reduce Processing Requirements for High Resolution Imaging
US 08490211 B1, July 16, 2013, Probes with magnetic coating, Sean P. Leary / Western Digital Technologies, Inc. (Irvine, US)
A method for referencing related magnetic head atomic force microscopy scans,…

Measuring Probe Device for a Probe Microscope, Measuring Cell and Scanning Probe Microscope
US 08505109 B2, Aug. 6, 2013, Liquid environment, Kathryn Anne Poole et al. / JPK Instruments AG (Berlin, DE)
A measuring probe device for a probe microscope, in particular a scanning probe…

Method for Cost-Efficient Manufacturing Diamond Tips for Ultra-High Resolution Electrical Measurements and Devices Obtained Thereof
US 08484761 B2, July 9, 2013, Shape or taper, Thomas Hantschel et al. / IMEC (Leuven, BE)
An atomic force microscopy probe configuration, comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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