Featured patents

Scanning Probe Microscope
US 08813261 B2, Aug. 19, 2014, By optical means, Naokatsu Nosaka et al. / Hitachi High-Tech Science Corporation (Minato-ku, Tokyo, JP)
A scanning probe microscope comprising:…

Mode-Synthesizing Atomic Force Microscopy and Mode-Synthesizing Sensing
US 08789211 B2, July 22, 2014, AC mode, Ali Passian et al. / UT-Battelle, LLC (OakRidge, US)
A sensor system comprising:…

Scanning Probe Microscope Having Support Stage Incorporating a Kinematic Flexure Arrangement
US 08782810 B2, July 15, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Carl Masser / Bruker Nano, Inc. (Santa Barbara, US)
A scanning probe microscope (SPM) comprising:…

Method for Examining a Measurement Object, and Apparatus
US 08769711 B2, July 1, 2014, Atomic Force Microscopy or apparatus therefor, e.g., AFM probes(EPO), Torsten Jähnke / JPK Instruments AG (Berlin, DE)
A method for examining a sample, said method comprising the steps of:…

Atomic Force Microscope System Using Selective Active Damping
US 08769710 B2, July 1, 2014, Circuits or algorithms therefor(EPO), Richard K. Workman et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method of operating an atomic force microscope (AFM) system comprising…

Cantilever, Cantilever System, and Probe Microscope and Adsorption Mass Sensor Including the Cantilever System
US 08719959 B2, May 6, 2014, Particular Type of Scanning Probe Microscopy or Microscope; Essential Components Thereof, Masatsugu Shigeno / SII Nano Technology Inc. (Chiba, JP)
A cantilever for use in a detecting device which is configured to perform…

Method for Driving a Scanning Probe Microscope at Elevated Scan Frequencies
US 08726409 B2, May 13, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Friedrich Esch et al. / Consiglio Nazionale Delle Ricerche (Rome, IT)
A method for operating a scanning probe microscope having a probe, adapted to be…

Microcantilever Microwave Probe
US 08661560 B1, Feb. 25, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, Xinxin Li et al. / PrimeNano, Inc. (Palo Alto, US)
An electrical probe, comprising:…

Electronic Control and Amplification Device for a Local Piezoelectric Force Measurement Probe Under a Particle Beam
US 08627511 B2, Jan. 7, 2014, Monitoring the Movement or Position of the Probe Responsive to Interaction With the Sample, Jerome Polesel / Commissariat a l'energie atomique et aux energies alternatives (Paris, FR)
An electronic control device for a local probe with a piezoelectric resonator…

Cantilever-Based Optical Fiber Probe Interfacial Force Microscope for Partial Immersion in Liquid
US 08549660 B2, Oct. 1, 2013, Liquid environment, Byung Kim / Boise State University (Boise, US)
An apparatus, comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

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