Featured patents

Radio-Frequency Reflectometry Scanning Tunneling Microscope
US 08863311 B1, Oct. 14, 2014, Probes, their manufacture, or their related instrumentation, e.g., holders, I-Jan Chen et al. / National Taiwan University (Taipei, TW)
A radio-frequency (RF) reflectometry scanning tunneling microscope suitable…

Apparatus and Method for Analyzing and Modifying a Specimen Surface
US 08769709 B2, July 1, 2014, Scanning or Positioning Arrangements, i.e., Arrangements for Actively Controlling the Movement or Position of the Probe, Thorsten Hofmann et al. / Carl Zeiss SMS GmbH (Jena, DE)
A probe assembly, comprising:…

Control System for a Scanning Probe Microscope
US 08732861 B2, May 20, 2014, Display or data processing devices, Andrew Humphris et al. / Infinitesima Ltd. (Oxfordshire, GB)
A control system for use with a scanning probe microscope of a type…

Coupled Mass-Spring Systems and Imaging Methods for Scanning Probe Microscopy
US 08646111 B2, Feb. 4, 2014, Auxiliary Means Serving to Assist or Improve the Scanning Probe Techniques or Apparatus, e.g., Display or Data Processing Devices, Kimberly L. Turner et al. / The Regents of the University of California (Oakland, US)
A coupled mass-spring system for use as a scanning probe microscope, comprising:…

Optimal Excitation Force Design Indentation-Based Rapid Broadband Nanomechanical Spectroscopy
US 08590061 B1, Nov. 19, 2013, Circuits or algorithms therefor(EPO), Zhonghua Xu et al. / Iowa State University Research Foundation, Inc. (Ames, US)
A method of determining an optimal input force to be applied to a scanning…

Method of Determining a Spring Constant of a Cantilever and Scanning Probe Microscope Using the Method
US 08584261 B2, Nov. 12, 2013, Probe manufacture, Hiroumi Momota et al. / SII Nanotechnology Inc. (Chiba, JP)
A method of manufacturing a cantilever for use in a scanning probe microscope,…

Method for Positioning an Atomic Force Microscopy Tip in a Cell
US 08528111 B2, Sept. 3, 2013, Non-SPM analyzing devices, e.g., Scanning Electron Microscope, spectrometer or optical microscope, Nazumi Alice Yamada et al. / Agilent Technologies, Inc. (Santa Clara, US)
A method for positioning a tip of an atomic force microscope relative…

Cantilever Excitation Device and Scanning Probe Microscope
US 08505111 B2, Aug. 6, 2013, With compensation for temperature or vibration induced errors, Takeshi Fukuma et al. / National University Corporation Kanazawa University (Ishikawa, JP)
A cantilever excitation device for exciting vibration of a cantilever,…

Prototyping Station for Atomic Force Microscope-Assisted Deposition of Nanostructures
US 08499361 B2, July 30, 2013, Particular Type of Scanning Probe Microscopy or Microscope; Essential Components Thereof, Timothy P. Holme et al. / The Board of Trustees of the Leland Stanford Junior University (Palo Alto, US)
A scanning probe microscope (SPM) isolation device, comprising a chamber divided…

Method for Cost-Efficient Manufacturing Diamond Tips for Ultra-High Resolution Electrical Measurements and Devices Obtained Thereof
US 08484761 B2, July 9, 2013, Shape or taper, Thomas Hantschel et al. / IMEC (Leuven, BE)
An atomic force microscopy probe configuration, comprising:…

Patentorg has 117 documents under Scanning-Probe Techniques or Apparatus; Applications of Scanning-Probe Techniques, e.g., Scanning Probe Microscopy (Spm) Patents.

Narrow down the browsing criteria below to see more patents.

Select a subcategory
Quick navigation
New documents
  • Process for the Production of the Actinobacillus Pleuropneumoniae Toxins APXI or APXIII in a Liquid Culture Medium Under Supply of Air Enriched in Carbon Dioxide
  • Method for Manufacturing Nonvolatile Memory Device
  • Supply Chain Demand Satisfaction
  • Supply-Line Management Device
  • Storage Control Device and Method for Managing Snapshot