Featured patents

Transceiver Feedback And/Or Re-Transmission Control
US 08856604 B2, Oct. 7, 2014, Request for retransmission, Brett Schein / Broadcom Corporation (Irvine, US)
A method of automatic repeat request ARQ feedback comprising:…

Transmitting Network Information Using Link or Port Aggregation Protocols
US 08839023 B2, Sept. 16, 2014, Repair failed node without replacement, Ali Sajassi et al. / Cisco Technology, Inc. (San Jose, US)
A method comprising:…

Semi-Automatic Conversion and Execution of Functional Manual Tests
US 08799720 B2, Aug. 5, 2014, Operator interface for diagnosing or testing, Tessa A. Lau et al. / International Business Machines Corporation (Armonk, US)
A system comprising:…

Viterbi Decoder Method and Apparatus With RI Detector in Servo Channel
US 08707147 B1, April 22, 2014, Viterbi decoding, Michael Madden et al. / Marvell International Ltd. (Hamilton, BM)
A system for decoding data stored on a data storage medium, the system…

Method for Detecting Return Link Packet Error in Hub Which Communicates With Satellite Terminal and Apparatus Thereof
US 08726133 B2, May 13, 2014, For packet or frame multiplexed data, Man-Kyu Park et al. / Electronics and Telecommunications Research Institute (Daejeon, KR)
A method for detecting a return link packet error in a hub which communicates…

Adjusting Soft-Output Values in Turbo Equalization Schemes to Break Trapping Sets
US 08700976 B2, April 15, 2014, Adaptive error-correcting capability, Kiran Gunnam et al. / LSI Corporation (San Jose, US)
An apparatus for recovering an error-correction-encoded codeword from a set…

Dynamic Device Identification for Making a JTAG Debug Connection With a Internet Browser
US 08671319 B2, March 11, 2014, Boundary scan, Vikas Varshney et al. / Texas Instruments Incorporated (Dallas, US)
A component testing and debugging system comprising of:…

Semiconductor Integrated Circuit and Method of Retrieving Signal to Semiconductor Integrated Circuit
US 08677201 B2, March 18, 2014, Scan path testing), Hiroaki Itou / Lapis Semiconductor Co., Ltd. (Tokyo, JP)
A semiconductor integrated circuit configured so that a transition scan test can…

Apparatus and Methods for Selective Block Decoding
US 08595603 B2, Nov. 26, 2013, Reed-Solomon code, Amir Rubin / Intel Corporation (Santa Clara, US)
An apparatus for selectively decoding data, comprising:…

Encoding Methods and Systems for Binary Product Codes
US 08499219 B2, July 30, 2013, Error correcting code with additional error detection code, Zhongfeng Wang / Broadcom Corporation (Irvine, US)
A data encoding circuit, comprising:…

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