Featured patents

Failure Protection in an Environment Including Virtualization of Networked Storage Resources
US 08856589 B1, Oct. 7, 2014, Backup or standby, Lee W. VanTine et al. / EMC Corporation (Hopkinton, US)
A system for protecting against failures in a plurality of storage area networks…

Method for System Recovery and Apparatus Supporting the Same
US 08812906 B2, Aug. 19, 2014, State recovery, Jong Rip Lee et al. / Samsung Electronics Co., Ltd. (Suwon-si, KR)
A system recovery method, comprising:…

System Redundancy and Site Recovery
US 08812895 B2, Aug. 19, 2014, Backup or standby, Mohammad Reza Shafiee / Verizon Patent and Licensing Inc. (Basking Ridge, US)
A computer-implemented method, comprising:…

Error Correction Decoder and Error Correction Method Thereof
US 08719669 B2, May 6, 2014, Code word parallel access, Yongwon Cho et al. / Samsung Electronics Co., Ltd. (Suwon-Si, Gyeonggi-Do, KR)
An error correction code (ECC) decoder processing data read from a storage media,…

Low-Latency Decoder
US 08578256 B2, Nov. 5, 2013, Parity generator or checker circuit detail, Nils Graef / Agere Systems LLC (Allentown, US)
An apparatus comprising a decoder for decoding error-correction encoded…

Double Data Rate Signal Testing Assistant Device
US 08589743 B2, Nov. 19, 2013, Memory testing, Jie Li / Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd. (Shenzhen, CN
A DDR signal testing assistant device, comprising:…

Timing-Aware Test Generation and Fault Simulation
US 08560906 B2, Oct. 15, 2013, Including test pattern generator, Xijiang Lin et al. / Mentor Graphics Corporation (Wilsonville, US)
A method of generating test patterns for testing an integrated circuit,…

Memory Refreshing Circuit and Method for Memory Refresh
US 08549366 B2, Oct. 1, 2013, Memory testing, Kenji Suzuki et al. / Fujitsu Limited (Kawasaki, JP)
A memory refreshing circuit that refreshes a memory at a refresh cycle,…

Storage Apparatus, Controller and Data Accessing Method Thereof
US 08504898 B2, Aug. 6, 2013, Error correction code for memory address, Chih-Kang Yeh et al. / Phison Electronics Corp. (Miaoli, TW)
A storage apparatus, comprising:…

System and Method for Grammar Based Test Planning
US 08489926 B2, July 16, 2013, Particular stimulus creation, Kevin Yoo et al. / Wurldtech Security Technologies (Vancouver, CA)
A system for testing of control devices, the system comprising:…

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