Featured patents

Media Monitoring Using Multiple Types of Signatures
US 08768003 B2, July 1, 2014, Applications, Francis Gavin McMillan / The Nielsen Company (US), LLC (Schaumburg, US
A media monitoring method comprising:…

System for Frame Selection for Optimal Registration of a Multi-Frame Dataset
US 08737713 B2, May 27, 2014, X-ray film analysis, John Baumgart / Siemens Medical Solutions USA, Inc. (Malvern, US)
An X-ray imaging system providing enhanced image feature visualization,…

Method and Computer System for Automatic Vectorization of a Vessel Tree
US 08712132 B2, April 29, 2014, Tomography, Christina Biermann et al. / Siemens Aktiengesellschaft (Munich, DE)
A method for automatic vectorization of the profile of a vessel tree…

Device for Creating And/Or Processing an Object Signature, Monitoring Device, Method and Computer Program
US 08670598 B2, March 11, 2014, Using a signature, Hartmut Loos et al. / Robert Bosch GmbH (Stuttgart, DE)
A device (2) for creating and/or processing an object signature of an object…

Method, Device and System for Dynamically Embedding Watermark Information Into Multimedia Content
US 08565472 B2, Oct. 22, 2013, Applications, Eiraj Rezania et al. / General Instrument Corporation (Horsham, US)
A device for embedding multimedia content with additional information,…

Optimised Region of Interest Selection
US 08538102 B2, Sept. 17, 2013, Biomedical applications, Mads Nielsen et al. / Synarc Inc (Newark, US)
A method for identifying a region of interest (ROI) in an object from a set…

Information Processing Apparatus Including a Plurality of Multi-Stage Connected Information Processing Units
US 08526738 B2, Sept. 3, 2013, Pattern Recognition, Satoshi Yashiro / Canon Kabushiki Kaisha (Tokyo, JP)
An information processing apparatus comprising:…

Multi-Scale Representation of an Out of Focus Image
US 08526760 B2, Sept. 3, 2013, Convolution, Adi Pinhas et al. / Superfish Ltd. (Petah Tikva, IL)
A method for generating a multi-scale representation of a blurred input image,…

Failure Analysis Method, Apparatus, and Program for Semiconductor Integrated Circuit
US 08478022 B2, July 2, 2013, Inspection of semiconductor device or printed circuit board, Masafumi Nikaido / Renesas Electronics Corporation (Kawasaki-shi, Kanagawa, JP)
A failure analysis method, for a semiconductor integrated circuit, said method…

Methods and Apparatus for Estimating Point-Of-Gaze in Three Dimensions
US 08457352 B2, June 4, 2013, Target tracking or detecting, Craig A. Hennessey et al. / The University of British Columbia (Vancouver, CA)
A method for determining a point-of-gaze (POG) of a user in three dimensions,…

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