Featured patents

Performing Error Detection on DRAMs
US 08811065 B2, Aug. 19, 2014, Capacitors, Michael John Sebastian Smith et al. / Google Inc. (Mountain View, US)
A memory module comprising:…

Memory Devices Having Data Lines Included in Top and Bottom Conductive Lines
US 08780631 B2, July 15, 2014, Logic connection, Toru Tanzawa / Micron Technology, Inc. (Boise, US)
An apparatus comprising:…

Nonvolatile Memory Device Having a Current Limiting Element
US 08681530 B2, March 25, 2014, Resistive, Imran Hashim et al. / Intermolecular, Inc. (San Jose, US)
A nonvolatile memory element, comprising:…

Static Random Access Memory Cell With Single-Sided Buffer and Asymmetric Construction
US 08654562 B2, Feb. 18, 2014, Resistive, Wah Kit Loh et al. / Texas Instruments Incorporated (Dallas, US)
A method of fabricating a memory in an integrated circuit, comprising the steps…

Temperature Detection Circuit of Semiconductor Memory Apparatus
US 08625375 B2, Jan. 7, 2014, Temperature compensation, Jong C. Lee et al. / Hynix Semiconductor Inc. (Gyeonggi-do, KR)
A temperature detection circuit of a semiconductor memory apparatus comprising:…

Memory Cell, Methods of Manufacturing Memory Cell, and Memory Device Having the Same
US 08547763 B2, Oct. 1, 2013, Bad bit, Jong-Pil Son et al. / Samsung Electronics Co., Ltd. (Suwon-si, Gyeonggi-do, KR)
A memory cell, comprising:…

Data Processing System
US 08509020 B2, Aug. 13, 2013, SiPo / PiSo, Kazuhiko Kajigaya / Elpida Memory, Inc. (Tokyo, JP)
An apparatus comprising:…

Method and Apparatus for Training a DLL in a Memory Subsystem
US 08520455 B2, Aug. 27, 2013, Strobe, Douglas C. Lee et al. / Apple Inc. (Cupertino, US)
An system comprising:…

Data Outputing Method of Memory Circuit and Memory Circuit and Layout Thereof
US 08498165 B2, July 30, 2013, Having particular data buffer or latch, Chih-Hao Chen et al. / Elite Semiconductor Memory Technology Inc. (Hsinchu, TW)
A data outputting method of a memory circuit, comprising:…

Resistive Memory Sensing Methods and Devices
US 08482955 B2, July 9, 2013, Resistive, Adam D. Johnson / Micron Technology, Inc. (Boise, US)
A method for resistive memory sensing, comprising:…

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