Featured patents

Semiconductor Memory Device, Method of Controlling Read Preamble Signal Thereof, and Data Transmission System
US 08811054 B2, Aug. 19, 2014, Associative Memories (Content Addressable Memory-Cam), Atsuo Koshizuka / PS4 Luxco S.A.R.L. (Luxembourg, LU)
A system, comprising:…

Signal Processing Circuit and Method for Driving the Same
US 08787073 B2, July 22, 2014, Flip-flop (electrical), Jun Koyama et al. / Semiconductor Energy Laboratory Co., Ltd. (Atsugi-shi, Kanagawa-ken, JP)
A signal processing circuit comprising:…

Sensing for All Bit Line Architecture in a Memory Device
US 08804432 B2, Aug. 12, 2014, Sensing circuitry, Giovanni Santin et al. / Micron Technology, Inc. (Boise, US)
A method for sensing in a memory device, the method comprising:…

Write and Erase Scheme for Resistive Memory Device
US 08787069 B2, July 22, 2014, Resistive, Sung Hyun Jo et al. / Crossbar, Inc. (Santa Clara, US)
A method for programming a two terminal resistive memory device, the method…

Memory Device and Test Method Thereof
US 08867288 B2, Oct. 21, 2014, Testing, Hyunju Yoon et al. / SK Hynix Inc. (Gyeonggi-do, KR)
A method for testing a memory device, comprising:…

Semiconductor Memory Apparatus and Test Method Using the Same
US 08687447 B2, April 1, 2014, Testing, Choung Ki Song et al. / SK Hynix Inc. (Gyeonggi-do, KR)
A semiconductor memory apparatus comprising:…

Variable Resistance Memory With a Select Device
US 08654560 B2, Feb. 18, 2014, Resistive, Wim Deweerd et al. / Intermolecular, Inc. (San Jose, US)
A memory array comprising:…

Memory Device and Method Using Encode Values for Access Error Condition Detection
US 08625365 B2, Jan. 7, 2014, Including signal comparison, Padmaraj Sanjeevarao et al. / Freescale Semiconductor, Inc. (Austin, US)
A method comprising:…

Flash Memory System Capable of Operating in a Random Access Mode
US 08576626 B2, Nov. 5, 2013, Parallel row lines, Ki-Hong Kim et al. / Samsung Electronics Co., Ltd. (Suwon-Si, Gyeonggi-Do, KR)
A memory system comprising:…

Semiconductor Memory Device
US 08514642 B2, Aug. 20, 2013, Bad bit, Jun Koyama / Semiconductor Energy Laboratory Co., Ltd. (Atsugi-shi, Kanagawa-ken, JP)
A semiconductor memory device comprising:…

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