Featured patents

Optical Position-Measuring Device
US 08817272 B2, Aug. 26, 2014, Special mark or target on object, Michael Hermann / Dr. Johnannes Heidenhein GmbH (Traunreut, DE)
An optical position-measuring device for detecting a position of two objects…

Optical Module and Spectroscopic Analyzer
US 08792101 B2, July 29, 2014, Fabry-Perot type or Etalon Type, Takeshi Nozawa / Seiko Epson Corporation JP
An optical module comprising:…

Interferometric Measurement of Displacement in Axial Direction of a Grating
US 08730483 B2, May 20, 2014, Having wavefront division, Katsuhiro Oyama et al. / Taiyo Yuden Co., Ltd. (Tokyo, JP)
A method for measuring displacement, comprising:…

Stroboscopic Light Source for a Transmitter of a Large Scale Metrology System
US 08711335 B2, April 29, 2014, Motion Stopping, Michael Sogard / Nikon Corporation (Tokyo, JP)
A transmitter for use in a metrology system, the transmitter comprising:…

Method for Using a Handheld Appliance to Select, Lock Onto, and Track a Retroreflector With a Laser Tracker
US 08724119 B2, May 13, 2014, Position or Displacement, Kenneth Steffey et al. / Faro Technologies, Inc. (Lake Mary, US)
A method for locking onto and tracking a selected retroreflector target…

System for Determining a Location on a 2D Surface or in a 3D Volume
US 08638451 B2, Jan. 28, 2014, Position or Displacement, Juris G Melkis et al. / Ivan Faul (Boulder, US)
A system for determining a location on a 2D surface or in a 3D volume…

Film Thickness Measuring Apparatus Using Interference and Film Thickness Measuring Method Using Interference
US 08619263 B2, Dec. 31, 2013, Thickness, Hirotoshi Oikaze et al. / Panasonic Corporation (Osaka, JP)
A film thickness measuring apparatus using interference, comprising:…

Method for Optically Scanning and Measuring an Object
US 08625106 B2, Jan. 7, 2014, Shape or Surface Configuration, Martin Ossig et al. / Faro Technologies, Inc. (Lake Mary, US)
A method for optically scanning and measuring an object by a laser scanner,…

Method and Apparatus for Turbidity Measurement
US 08576399 B2, Nov. 5, 2013, Having particles suspended in liquid, Rudiger Frank et al. / Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG (Gerlingen, DE)
A method for turbidity measurement in a measured medium by means of an apparatus…

Surface Inspecting Apparatus and Surface Inspecting Method
US 08493557 B2, July 23, 2013, Inspection of Flaws or Impurities, Shigeru Matsui / Hitachi High-Technologies Corporation (Tokyo, JP)
A surface inspecting method employing a surface inspecting apparatus, the surface…

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