Featured patents

Tomographic Phase Microscopy
US 08848199 B2, Sept. 30, 2014, For refractive indexing, Michael S. Feld et al. / Massachusetts Institute of Technology (Cambridge, US)
An interferometric method for measuring refractive index of a medium comprising:…

Methods and Devices for Optically Determining a Characteristic of a Substance
US 08780352 B2, July 15, 2014, For Light Transmission or Absorption, David Perkins et al. / Halliburton Energy Services, Inc. (Houston, US)
A method of determining a characteristic of a sample, comprising:…

Detection Apparatus
US 08767198 B2, July 1, 2014, Photometers, Gwo-Jiun Sheu et al. / Genesis Photonics Inc (Tainan, TW)
A detection apparatus, comprising:…

Detection Method for Birefringence Measurement
US 08743360 B2, June 3, 2014, With birefringent element, Baoliang Wang / Hinds Instruments, Inc. (Hillsboro, US)
A method of controlling a light beam in an optical system that includes a light…

Liquid Core Photonic Crystal Fiber Biosensors Using Surface Enhanced Raman Scattering and Methods for Their Use
US 08717558 B2, May 6, 2014, With Raman type light scattering, Claire Gu et al. / The Regents of the University of California (Oakland, US)
A process for fabricating a photonic crystal fiber, the method comprising…

Photoelectric Autocollimation Method and Apparatus Based on Beam Drift Compensation
US 08724108 B2, May 13, 2014, By Polarized Light Examination, Jiwen Cui et al. / Harbin Institute of Technology (Harbin, CN)
A photoelectric autocollimation method based on beam drift compensation…

Spectral Sensor for Checking Documents of Value
US 08711339 B2, April 29, 2014, Document Pattern Analysis or Verification, Wolfgang Rauscher et al. / Giesecke & Devrient GmbH (Munich, DE)
A spectral sensor for checking a document of value which, upon the operation…

Method and Apparatus for Identifying and Correcting Spherical Aberrations in a Microscope Imaging Beam Path
US 08724103 B2, May 13, 2014, Lens or Reflective Image Former Testing, Peter Euteneuer et al. / Leica Microsystems CMS GmbH (Wetzlar, DE)
A method for identifying a spherical error of a microscope imaging beam path…

Method to Measure Particle Mobility in Solution With Scattered and Unscattered Light
US 08525991 B2, Sept. 3, 2013, By Electrophoresis, Steven P. Trainoff et al. / Wyatt Technology Corporation (Santa Barbara, US)
A method to measure the electrophoretic mobility of particles in a sample…

Optical System
US 08456641 B1, June 4, 2013, Of Light Reflection, Noah Bareket et al. / KLA-Tencor Corporation (Milpitas, US)
An optical system for imaging a sample, the optical system comprising:…

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