Featured patents

Optoelectronic Sensor
US 08836957 B2, Sept. 16, 2014, Occulting a projected light beam, Axel Hauptmann et al. / Sick AG (Waldkirch, DE)
An optoelectronic sensor (10), with a plurality of light transmitters (14)…

Integrated Plasmonic Nanocavity Sensing Device
US 08848194 B2, Sept. 30, 2014, Of Light Reflection, Jurriaan Schmitz et al. / Integrated Plasmonics Corporation (San Francisco, US)
An integrated plasmonic sensing device comprising:…

Multichip CCD Camera Inspection System
US 08804111 B2, Aug. 12, 2014, On patterned or topographical surface, Boris Golovanevsky / KLA-Tencor Corporation (Milpitas, US)
A surface inspection system, comprising:…

Non-Destructive Stress Profile Determination in Chemically Tempered Glass
US 08873028 B2, Oct. 28, 2014, By light interference detector, Edward Byun et al. / Apple Inc. (Cupertino, US)
An apparatus comprising:…

Wavefront Aberration Measuring Method and Device Therefor
US 08705024 B2, April 22, 2014, Photometers, Keiko Oka et al. / Hitachi, Ltd. (Tokyo, JP)
A wavefront aberration measuring device, comprising:…

Integral Transformed Optical Measurement Method and Apparatus
US 08649010 B2, Feb. 11, 2014, For Light Transmission or Absorption, Nanguang Chen
A method for measuring integral transformed optical signals, comprising…

Defect Inspecting Method and Defect Inspecting Apparatus
US 08638429 B2, Jan. 28, 2014, Surface condition, Shigenobu Maruyama et al. / Hitachi High-Technologies Corporation (Tokyo, JP)
A defect inspecting method of inspecting a surface state including a defect…

Attraction State Inspection Device, Surface Mounting Apparatus, and Part Test Device
US 08634079 B2, Jan. 21, 2014, With diffusion, Tadashi Onishi / Yamaha Hatsudoki Kabushiki Kaisha (Shizuoka-Ken, JP)
An attraction state inspection device comprising:…

Micro-Radian Class Line of Sight and Centration Stabilization System
US 08531657 B2, Sept. 10, 2013, Automatic following or aligning while indicating measurement, Frederick B. Koehler et al. / Raytheon Company (Waltham, US)
A laser projection system comprising:…

Method for Estimating Light Scattering
US 08508733 B2, Aug. 13, 2013, By Particle Light Scattering, Jean-Eudes Marvie et al. / Thomson Licensing (Issy les Moulineaux, FR)
A method for calculating the quantity of light scattered by a heterogeneous…

Patentorg has 2290 documents under Optics: Measuring and Testing Patents.

Narrow down the browsing criteria below to see more patents.

Select a subcategory
Quick navigation
New documents
  • Process for the Production of the Actinobacillus Pleuropneumoniae Toxins APXI or APXIII in a Liquid Culture Medium Under Supply of Air Enriched in Carbon Dioxide
  • Method for Manufacturing Nonvolatile Memory Device
  • Supply Chain Demand Satisfaction
  • Supply-Line Management Device
  • Storage Control Device and Method for Managing Snapshot