Featured patents

Integrated Analytical System and Method
US 08867038 B2, Oct. 21, 2014, For Light Transmission or Absorption, Stephen Turner et al. / Pacific Biosciences of California, Inc. (Menlo Park, US)
A method for sequencing a plurality of template nucleic acid molecules…

Method for Detecting Particles and Defects and Inspection Equipment Thereof
US RE044977 E1, July 1, 2014, Detection of object or particle on surface, Takahiro Togashi et al. / Hitachi High-Technologies Corporation (Tokyo, JP)
An inspection apparatus which detects an anomaly of a substrate comprising;…

Distance Measuring Apparatus and Distance Measuring Method
US 08760632 B2, June 24, 2014, Using at least a pair of viewing axes, Masayuki Usami / Toyota Jidosha Kabushiki Kaisha (Toyota-shi, JP)
A distance measuring apparatus comprising:…

Measurement Systems and Methods
US 08643849 B2, Feb. 4, 2014, Shape or Surface Configuration, Shukuan Xu et al. / General Electric Company (Schenectady, US)
A measurement system, comprising:…

Systems for Measuring Properties of a Physiological Fluid Suspension
US 08559007 B2, Oct. 15, 2013, By Particle Light Scattering, Syed F. Mohammad et al. / Aggredyne, Inc. (Houston, US)
A method of evaluating the ability of a fluid to clot, comprising:…

Sensor Element for a Sorting Device and Method for Sorting Products
US 08564766 B2, Oct. 22, 2013, Detection of object or particle on surface, Paul Berghmans / Best 2 NV (Heverlee, BE)
A sorting device comprising:…

Distance Measurement System and Method Thereof
US 08537339 B2, Sept. 17, 2013, Of focused image size or dimensions, En-Feng Hsu et al. / PixArt Imaging Inc. (Science-Based Industrial Park, Hsin-Chu, TW)
A method of performing distance measurement, comprising:…

Automated Document Processing System and Method
US 08514379 B2, Aug. 20, 2013, Document Pattern Analysis or Verification, Paul A. Jones et al. / Cummins-Allison Corp. (Mt. Prospect, US)
A document processing device comprising:…

Position Measuring Arrangement
US 08477317 B2, July 2, 2013, Displacement or distance, Michael Stepputat et al. / Dr. Johannes Heidenhain GmbH (Traunreut, DE)
A position measuring arrangement for determining the position of a spatial point,…

Apparatus and Method for Inspecting Defect on Object Surface
US 08482728 B2, July 9, 2013, On patterned or topographical surface, Sachio Uto et al. / Hitachi High-Technologies Corporation (Tokyo, JP)
A defect inspection apparatus comprising:…

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