Featured patents

Method and Apparatus for Phase Detection in a Beam Steering Laser Array
US 08792099 B1, July 29, 2014, By Light Interference, Oleg M. Efimov / HRL Laboratories, LLC (Malibu, US)
A method for collecting optical information for measurement of individual phases…

Optical Distance-Measuring Device and Electronic Device
US 08780330 B2, July 15, 2014, With photodetection, Hideo Wada et al. / Sharp Kabushiki Kaisha (Osaka, JP)
An optical distance-measuring device that measures a distance to an object…

Method of Measuring the Thickness of a Moving Web
US 08760669 B2, June 24, 2014, Thickness, Michael Kon Yew Hughes et al. / Honeywell ASCa Inc. (Mississauga, CA)
A detector device for contact support of a flexible continuous web being…

Surface Plasmon Resonance Sensor
US 08743369 B2, June 3, 2014, Of Light Reflection, Doron Lipson et al. / Bio-Rad Laboratories Inc. (Hercules, US)
A surface plasmon resonance (SPR) system using a ligand, the system comprising:…

Interchangeable Chromatic Range Sensor Probe for a Coordinate Measuring Machine
US 08736817 B2, May 27, 2014, With photodetection, Andrew Michael Patzwald et al. / Mitutoyo Corporation (Kawasaki-shi, JP)
A chromatic range sensor (CRS) probe system capable of being automatically…

Imprint Apparatus, Detection Method, Article Manufacturing Method, and Foreign Particle Detection Apparatus
US 08687183 B2, April 1, 2014, On patterned or topographical surface, Takanori Uemura et al. / Canon Kabushiki Kaisha JP
An imprint apparatus for performing an imprint process of transferring a pattern…

Multipass Cell Using Spherical Mirrors While Achieving Dense Spot Patterns
US 08531659 B2, Sept. 10, 2013, Fluid containers, Stephen So et al. / The Laser Sensing Company (Plainsboro, US)
A multipass optical cell comprising…

Substrate for Surface Enhanced Raman Scattering (SERS)
US 08547549 B2, Oct. 1, 2013, With Raman type light scattering, Jing Tang et al. / Hewlett-Packard Development Company, L.P. (Houston, US)
A substrate for Surface Enhanced Raman Scattering (SERS), said substrate…

Optical Signal Inspection Device
US 08520201 B2, Aug. 27, 2013, Sample, Specimen, or Standard Holder or Support, Yen-Chang Huang / Hobbes & Co., Ltd. (New Taipei, TW)
An optical signal inspection device, comprising:…

Structure of Measurement Window
US 08456627 B2, June 4, 2013, Sample, Specimen, or Standard Holder or Support, Harri Salo / Janesko Oy (Vantaa, FI)
A measurement window structure for an optical process measurement device,…

Patentorg has 2290 documents under Optics: Measuring and Testing Patents.

Narrow down the browsing criteria below to see more patents.

Select a subcategory
Quick navigation
New documents
  • Process for the Production of the Actinobacillus Pleuropneumoniae Toxins APXI or APXIII in a Liquid Culture Medium Under Supply of Air Enriched in Carbon Dioxide
  • Method for Manufacturing Nonvolatile Memory Device
  • Supply Chain Demand Satisfaction
  • Supply-Line Management Device
  • Storage Control Device and Method for Managing Snapshot