Featured patents

Apparatus for Measuring a Spectral Distribution of a Translucent Printed Product Produced With a Printing Device
US 08625092 B2, Jan. 7, 2014, Christina Tatarczyk et al. / Theta System Elektronik GmbH DE
Apparatus (10) for measuring a spectral distribution of a translucent printed…

Bandwidth Tunable Spectroscopic Device
US 08553225 B2, Oct. 8, 2013, John F. Silny / Raytheon Company (Waltham, US)
An electromagnetic radiation detection device comprising:…

Broad Band Czerny-Turner Spectrometer, Methods, and Applications
US 08873049 B2, Oct. 28, 2014, Kye-Sung Lee et al. / University of Rochester (Rochester, US)
A Czerny-Turner-type spectrometer, comprising: a first spherical mirror disposed…

Curved Grating Spectrometer and Wavelength Multiplexer or Demultiplexer With Very High Wavelength Resolution
US 08854620 B2, Oct. 7, 2014, Yingyan Huang et al. / OptoNet Inc. (Evanston, US)
A wavelength multiplexer/demultiplexer suitable for analyzing a spectra…

Curved Grating Spectrometer and Wavelength Multiplexer or Demultiplexer With Very High Wavelength Resolution
US 08462338 B1, June 11, 2013, Seng-Tiong Ho et al. / (Wheeling, US)
A wavelength multiplexer/demultiplexer/compact spectrometer device suitable…

Echelle Grating Multi-Order Imaging Spectrometer Utilizing a Catadioptric Lens
US 08736836 B2, May 27, 2014, Joel M. Bowers et al. / Lawrence Livermore National Security, LLC. (Livermore, US)
A cryogenically cooled imaging spectrometer apparatus, comprising:…

High Resolution Slit-Free Direct-Viewing Multiplexing Field Spectrograph
US 08749781 B2, June 10, 2014, Ronald Anthony Masters
A spectrograph comprising:…

Linearized Variable-Dispersion Spectrometers and Related Assemblies
US 08797530 B2, Aug. 5, 2014, Christopher Saxer et al. / Bioptigen, Inc. (Durham, US)
A wavenumber linearized spectrometer, the spectrometer comprising:…

Method and Device for Optically Examining the Interior of Turbid Media
US 08531662 B2, Sept. 10, 2013, Martinus Bernardus Van Der Mark / Koninklijke Philips N.V. (Eindhoven, NL)
A method for optically examining an interior of turbid media, the method…

Microscanning System With Relay Lens Device and Hyper-Spectrometer Device
US 08760647 B2, June 24, 2014, Ming-Hsui Tsai et al. / China Medical University (Taichung, TW)
A microscanning system, comprising:…

Miniature Spectrometer With Stray Light Filtering Structure
US 08717561 B2, May 6, 2014, Cheng-Hao Ko / OtO Photonics, Inc. TW
A miniature spectrometer, comprising:…

Monochromator Having a Tunable Grating
US 08786853 B2, July 22, 2014, Robert Lockhart et al. / CSEM Centre Suisse d'Electronique et de Microtechnique SA—Recherche et Developpement (Neuchatel, CH)
A spectrometer, comprising:…

Multi Field of View Hyperspectral Imaging Device and Method for Using Same
US 08823932 B2, Sept. 2, 2014, Richard L Wiggins et al. / Corning Incorporated (Corning, US)
A multi field of view hyperspectral imaging device for imaging a remote object,…

Optical Multiplexer/Demultiplexer
US 08711352 B2, April 29, 2014, James D. Targove et al. / BAE Systems Information and Electronic Systems Integration Inc. (Nashua, US)
A compact optical multiplexer/demultiplexer system, comprising:…

Optical Multiplexer/Demultiplexer
US 08564775 B2, Oct. 22, 2013, James D. Targove et al. / BAE Systems Information and Electronic Systems Integration Inc. (Nashua, US)
A compact apparatus for optical spectrometry comprising:…

Optical Spectrometer Element Having Non-Spherical Mirrors
US 08649009 B2, Feb. 11, 2014, Wolfram Bohle / Spectro Analytical Instruments GmbH (Kleve, DE)
A spectrometer for analyzing the optical emission of a sample having:…

Optical Unit
US 08570510 B2, Oct. 29, 2013, Ippei Kamimura / NEC System Technologies, Ltd. (Osaka, JP)
An optical unit comprising:…

Selective Diffraction With In-Series Gratings
US 08873050 B1, Oct. 28, 2014, Klaus Flock / KLA-Tencor Corp. (Milpitas, US)
A system configured to determine information for a wafer, comprising:…

Shaped Input Apertures to Improve Resolution in Grating Spectrometers
US 08786855 B2, July 22, 2014, Jason M. Eichenholz et al. / Ocean Optics, Inc. (Dunedin, US)
A device for improving image quality in a grating spectrometer or monochromator…

Spectral Characteristic Measuring Device and Image Forming Apparatus
US 08559005 B2, Oct. 15, 2013, Manabu Seo et al. / Ricoh Company, Ltd. (Tokyo, JP)
A spectral characteristic measuring device, comprising:…

Spectral Distribution Measuring Device
US 08497988 B2, July 30, 2013, Kohei Shimbo et al. / Ricoh Company, Ltd. (Tokyo, JP)
A spectral distribution measuring device, comprising:…

Spectral Module
US 08804118 B2, Aug. 12, 2014, Katsumi Shibayama et al. / Hamamatsu Photonics K.K. (Hamamatsu-shi, Shizuoka, JP)
A spectral module comprising:…

Spectrograph Having Multiple Wavelength Ranges for High Resolution Raman Spectroscopy
US 08514394 B2, Aug. 20, 2013, Ming Chai et al. / BaySpec, Inc. (Fremont, US)
A spectrograph for measuring radiation as a function of wavelength comprising:…

Spectrometer Arrangement
US 08873048 B2, Oct. 28, 2014, Michael Okruss et al. / Leibniz—Institut für Analytische Wissenschaften—ISAS—e.V. (Dortmund, DE)
A spectrometer assembly adapted for radiation to enter said spectrometer assembly…

Spectrometer Capable of Eliminating Side-Tail Effects
US 08508731 B2, Aug. 13, 2013, Cheng-Hao Ko / OTO Photonics, Inc. (Hsinchu, TW)
A spectrometer capable of eliminating side-tail effects, the spectrometer…

Spectrometer Design for Aberration Correction, Simplified Manufacture, and Compact Footprint
US 08797529 B2, Aug. 5, 2014, David R. Demmer et al. / Ocean Optics, Inc. (Dunedin, US)
A method of aligning a compact spectrometer device comprising a light entrance…

Spectrometer, and Image Evaluating Unit and Image Forming Device Incorporating the Same
US 08755046 B2, June 17, 2014, Manabu Seo et al. / Ricoh Company, Ltd. (Tokyo, JP)
A spectrometer comprising:…

Spectrometric Investigation of Heterogeneity
US 08564774 B2, Oct. 22, 2013, E. Neil Lewis / Malvern Instruments Ltd (Malvern, GB)
A spectroscopic apparatus for investigating heterogeneity of a sample area,…

Spectroscope
US 08614791 B2, Dec. 24, 2013, Yuji Ikeda / Imagineering, Inc. (Kobe-shi, Hyogo, JP)
A spectroscope comprising:…

Spectroscope
US 08477305 B2, July 2, 2013, Masashi Ito et al. / Hamamatsu Photonics K.K. (Hamamatsu-shi, Shizuoka, JP)
A spectrometer comprising: a package on which a light-guiding portion is…

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