Featured patents

Method and System for Using Non-Variable Compression Group Size in Partial Cloning
US 08866649 B2, Oct. 21, 2014, To or from variable length codes, Dnyaneshwar Pawar et al. / Netapp, Inc. (Sunnyvale, US)
A machine implemented method for partially cloning a data container, comprising:…

Scheme for Balancing Skew Between Lanes of High-Speed Serial Digital Interface
US 08760325 B2, June 24, 2014, Data rate conversion, Ivan R Ryan / Analog Devices, Inc. (Norwood, US)
A method of aligning a pair of clock signals whose frequencies differ by a factor…

Compensation of Nonlinearity of Single Ended Digital to Analog Converters
US 08653995 B2, Feb. 18, 2014, Field effect transistor, Franz Kuttner / Intel Mobile Communications GmbH (Neubiberg, DE)
An apparatus, comprising:…

Counter Circuits, Analog to Digital Converters, Image Sensors and Digital Imaging Systems Including the Same
US 08618974 B2, Dec. 31, 2013, Single comparator and counter, Uzi Hizi et al. / Samsung Electronics Co., Ltd. (Gyeonggi-do, KR)
A counter circuit comprising:…

Digital-To-Analog Converter
US 08599057 B2, Dec. 3, 2013, Coarse and fine conversions, Mei-Chen Chuang et al. / Taiwan Semiconductor Manufacturing Company, Ltd. (Hsin-Chu, TW)
A method comprising:…

Multi-Cell Voltage Secure Data Encoding in Hybrid Vehicles
US 08581751 B2, Nov. 12, 2013, Digital Code to Digital Code Converters, Scott A. Martin et al. / GM Global Technology Operations LLC (Detroit, US)
A method of encoding vehicle data comprising a first voltage pertaining…

A/D Conversion Device
US 08593323 B2, Nov. 26, 2013, Analog to digital conversion, Shuichi Kato / Olympus Corporation (Tokyo, JP)
An A/D conversion device which converts an analog input voltage to a digital…

Combined Digital Output System
US 08593316 B2, Nov. 26, 2013, Temperature compensation, Robert Rieger / Industrial Technology Research Institute (Hsinchu, TW)
A combined digital output system, comprising:…

Power Supply Apparatus for Test Apparatus
US 08547265 B2, Oct. 1, 2013, Converter is part of control loop, Hironori Tanaka et al. / Advantest Corporation (Tokyo, JP)
A power supply apparatus for a test apparatus configured to supply a power supply…

Variable-Length Code Decoding Apparatus, Decoding System, and Variable-Length Code Decoding Method
US 08456334 B2, June 4, 2013, To or from variable length codes, Akira Moriya / Kabushiki Kaisha Toshiba (Tokyo, JP)
A variable-length code decoding apparatus for decoding an input bitstream…

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