Featured patents

Compact Paramagnetic Oxygen Sensor
US 08847579 B2, Sept. 30, 2014, Susceptibility, Christopher R. Edwards et al. / Servomex Group Limited GB
An apparatus for the measurement of the magnetic susceptibility of a gas mixture,…

Durability Enhanced and Redundant Embedded Sensors
US 08803515 B2, Aug. 12, 2014, Induced voltage-type sensor, Neil J. Goldfine et al. / JENTEK Sensors, Inc. (Waltham, US)
A substantially planar sensor having a first surface and a second surface,…

NMR RF Probe Coil Exhibiting Double Resonance
US 08779768 B2, July 15, 2014, Using a nuclear resonance spectrometer system, Arthur Edison et al. / The Florida State University Research Foundation, Inc. (Tallahassee, US)
A nuclear magnetic resonance probe, comprising:…

Electrical Double Layer Capacitive Devices and Methods of Using Same for Sequencing Polymers and Detecting Analytes
US 08860438 B2, Oct. 14, 2014, Where a material or object forms part of the dielectric being measured, Guigen Zhang / Clemson University Research Foundation (Clemson, US)
An electrical double layer (EDL) capacitive device comprising:…

System for Post-Processing of Electronic Components
US 08717048 B2, May 6, 2014, Burn-in, Reinhart Richter et al. / Multitest Elektronische Systems GmbH (Rosenheim, DE)
A method of post-processing a plurality of electronic components…

Method and Device for Fast Measurement of Frequency Response With Scalable Short Chirp Signals
US 08674680 B2, March 18, 2014, Frequency of cyclic current or voltage, Mart Minn et al. / Tallinn University of Technology OÜ Eliko Tehnoloogia Arenduskeskus (Tallinn, EE)
A method for fast measurement of frequency response of an object having…

Method of Designing an Application Specific Probe Card Test System
US 08581610 B2, Nov. 12, 2013, Test probe techniques, Roy J Henson et al.
A method of programming a probe card comprising channel connectors to an external…

Space Transformers Employing Wire Bonds for Interconnections With Fine Pitch Contacts
US RE044407 E1, Aug. 6, 2013, Probe contact enhancement or compensation, January Kister / FormFactor, Inc. (Livermore, US)
An apparatus for electrical testing, comprising:…

Capacitance Meter, Method, Computer Program and Computer Program Product for Improved Capacitance Measurement
US 08446157 B2, May 21, 2013, With frequency signal response, change or processing circuit, Hans Olof Fröjd / ABB Technology AG (Zürich, CH)
A capacitance meter, comprising:…

Electrical Instrument Platform for Mounting on and Removal From an Energized High Voltage Power Conductor
US RE044256 E1, June 4, 2013, For fault location, Paul Alex et al. / Underground Systems, Inc. (Armonk, US)
An apparatus for monitoring the operation of an electric power conductor,…

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