Featured patents

Semiconductor Apparatus and Method of Testing and Manufacturing the Same
US 08823409 B2, Sept. 2, 2014, Test of semiconductor device, Tae Yong Lee / SK Hynix Inc. (Gyeonggi-do, KR)
A semiconductor apparatus comprising:…

Semiconductor Apparatus and Probe Test Method Thereof
US 08829933 B2, Sept. 9, 2014, Contact probe, Jong Chern Lee et al. / SK Hynix Inc. (Gyeonggi-do, KR)
A semiconductor apparatus comprising:…

Semiconductor Device Including Switch for Coupling Power Line
US 08786304 B2, July 22, 2014, Test of semiconductor device, Kenichi Kawasaki / Fujitsu Limited (Kawasaki, JP)
A semiconductor device comprising:…

Directional Fault Sectionalizing System
US 08866487 B2, Oct. 21, 2014, By voltage or current measuring, Joseph R. Rostron et al. / Southern States, LLC (Hampton, US)
A directional fault sectionalizing system for a three phase electric power line…

Pass Through Device for Non-Contact Voltage Detectors
US 08779752 B2, July 15, 2014, Measuring, Testing, or Sensing Electricity, Per Se, Philip Brown Allen, Jr. / Grace Engineered Products, Inc. (Davenport, US)
A device for allowing an electrical worker to use a non-contact voltage detector…

Integrated Circuit and a Method for Testing a Multi-Tap Integrated Circuit
US 08754668 B2, June 17, 2014, Printed circuit board, Dimitri Akselrod et al. / Freescale Semiconductor, Inc. (Austin, US)
An integrated circuit comprising:…

Vertical Micro Contact Probe Having Variable Stiffness Structure
US 08723541 B2, May 13, 2014, Probe structure, Hak-Joo Lee et al. / Korea Institute of Machinery & Materials (Daejeon, KR)
A vertical micro contact probe for electric inspection of a semiconductor chip,…

Dose Profile Measurement System for Clinical Proton Fields
US 08552731 B2, Oct. 8, 2013, For analysis of gas, vapor, or particles of matter, Alan Eads et al. / Indiana University Research and Technology Corp (Bloomington, US)
A proton field measurement apparatus comprising:…

Two-Axis Magnetic Field Sensor Having Reduced Compensation Angle for Zero Offset
US 08508221 B2, Aug. 13, 2013, Thin film magnetometers, Phillip Mather et al. / Everspin Technologies, Inc. (Chandler, US)
A magnetoresistive thin-film magnetic field sensor, comprising:…

Electronic Circuit Tester and Method of Use
US 08493060 B1, July 23, 2013, Watts, Mark D. Mahoney
A method of detecting a single occurrence of a pulse of load current…

Patentorg has 2949 documents under Electricity: Measuring and Testing Patents.

Narrow down the browsing criteria below to see more patents.

Select a subcategory
Quick navigation
New documents
  • Process for the Production of the Actinobacillus Pleuropneumoniae Toxins APXI or APXIII in a Liquid Culture Medium Under Supply of Air Enriched in Carbon Dioxide
  • Method for Manufacturing Nonvolatile Memory Device
  • Supply Chain Demand Satisfaction
  • Supply-Line Management Device
  • Storage Control Device and Method for Managing Snapshot