Featured patents

Inspection Apparatus for Sheet
US 08822926 B2, Sept. 2, 2014, Measuring infrared radiation reflected from sample, Kentaro Ohama / Komori Corporation (Tokyo, JP)
An inspection apparatus for a sheet subjected to a process to impart…

Ion Mobility Spectrometers
US 08766173 B2, July 1, 2014, Methods, Jonathon Richard Atkinson / Smiths Detection-Watford Limited (Watford, Hertfordshire, GB)
A method of operating an ion mobility spectrometer to distinguish between…

Chirped-Pulse Terahertz Spectroscopy
US 08748822 B1, June 10, 2014, Including spectrometer or spectrophotometer, Eyal Gerecht et al. / University of Massachusetts (Boston, US)
A method for gas sensing, the method comprising:…

Method for Measuring Size of Specimen
US 08716661 B1, May 6, 2014, Methods, San Lin Liew / Inotera Memories, Inc. (Hwa-Ya Technology Park Kueishan, Taoyuan, TW)
A method of measuring a size, comprising:…

Surface Electromagnetic Waves in Photonic Band Gap Multilayers
US 08692211 B2, April 8, 2014, Luminophor Irradiation, William M. Robertson
A photonic circuit with a signal medium, comprising:…

Auger Elemental Identification Algorithm
US 08658973 B2, Feb. 25, 2014, Electron Energy Analysis, Mehran Nasser-Ghodsi et al. / KLA-Tencor Corporation (Milpitas, US)
A method of Auger spectral analysis of an input spectrum, the input spectrum…

Systems and Methods for Optics Cleaning in an EUV Light Source
US 08633459 B2, Jan. 21, 2014, Ultraviolet or infrared source, Alexander N. Bykanov et al. / Cymer, LLC (San Diego, US)
An extreme ultraviolet (EUV) light source comprising;…

Clear Overcoat Compositions and Methods for Using and Detecting the Same
US 08629414 B2, Jan. 14, 2014, Methods, Peter G. Odell et al. / Xerox Corporation (Norwalk, US)
A method for detecting an overcoated image and for protecting an underlying…

Track-Based Metrology Method and Apparatus
US 08513625 B2, Aug. 20, 2013, Irradiation of semiconductor devices, Joseph Bach et al. / Applied Materials, Inc. (Santa Clara, US)
A method of manufacturing semiconductor wafers using a photolithographic track…

Integrated Circuit Sample Preparation for Alpha Emission Measurements
US 08471215 B1, June 25, 2013, Methods, Yair Faiershtein et al. / Marvell Israel (M.I.S.L) Ltd. (Yokneam, IL
An alpha particle emissions test component extracted from an integrated circuit…

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