Featured patents

Method for Nanolithography
US 08841637 B2, Sept. 23, 2014, Irradiation of semiconductor devices, Keith Edward Bennett et al.
A method for performing nanolithography using multiple exposures, comprising:…

Laser Sustained Plasma Bulb Including Water
US 08796652 B2, Aug. 5, 2014, Ultraviolet or infrared source, Anatoly Shchemelinin et al. / KLA-Tencor Corporation (Milpitas, US)
A laser sustained plasma light source, comprising:…

Photon Counting Detector to Generate High-Resolution Images and High-Contrast Images, and Photon Counting and Detecting Method Using the Same
US 08772730 B2, July 8, 2014, X-ray or gamma-ray system, Sang-wook Han et al. / Samsung Electronics Co., Ltd. (Suwon-si, KR)
A photon counting detector, comprising:…

Ultraviolet Water Treatment Apparatus
US 08742365 B2, June 3, 2014, Source and object encasement, Takeshi Ide et al. / Kabushiki Kaisha Toshiba (Tokyo, JP)
An ultraviolet water treatment apparatus comprising:…

Nonoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectrometery
US 08614416 B2, Dec. 24, 2013, Ionic Separation or Analysis, Kelley L. Waters et al. / Ionwerks, Inc. (Houston, US)
An analytical instrument for the characterization and analysis of a sample…

Semiconductor Device Having a Photodiode Electrically Connected to a Back Gate of a Transistor and Driving Method Thereof
US 08581170 B2, Nov. 12, 2013, Special photocell or electron tube circuits, Yoshiyuki Kurokawa / Semiconductor Energy Laboratory Co., Ltd. (Atsugi-shi, Kanagawa-ken, JP)
A semiconductor device comprising:…

Apparatus for Producing Photocatalytic Reaction Water
US 08552399 B2, Oct. 8, 2013, Flow-enclosed radiation source, Mizuki Kawakatsu et al. / K2R Co., Ltd. (Fukuoka, JP)
An apparatus for producing photocatalytic reaction water, comprising:…

Fluoroperovskite Radiation Dosimeters and Storage Phosphors
US 08563949 B2, Oct. 22, 2013, Dosimeter, Andrew Edgar et al.
A phosphor-doped fluoroperovskite compound, wherein the compound stores at least…

Charged Particle Beam Device and Sample Observation Method
US 08552373 B2, Oct. 8, 2013, Electron probe type, Mari Nozoe et al. / Hitachi High-Technologies Corporation (Tokyo, JP)
A charged particle beam device that observes a sample, the device comprising:…

Increasing Edge Sensitivity in a Radiation Detector
US 08450692 B2, May 28, 2013, Methods, Stefan B. Siegel et al. / Siemens Medical Solutions USA, Inc. (Malvern, US)
A radiation detection device comprising:…

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