Featured patents

Enhanced Optical Reflective Encoder
US 08847144 B2, Sept. 30, 2014, Shaft angle transducers, Wee Jin Yeap et al. / Avago Technologies General IP (Singapore) Pte. Ltd. (Singapore, SG
An encoder for use in an optical encoding system, comprising:…

Dosimetry Apparatus, Systems, and Methods
US 08841622 B2, Sept. 23, 2014, Dose or dose rate measurement, Jukka Kahilainen et al. / Mirion Technologies, Inc. (San Ramon, US)
A direct ion storage (DIS) radiation dosimeter, comprising:…

Noise-Matching Dynamic Bias for Column Ramp Comparators in a CMOS Image Sensor
US 08872088 B2, Oct. 28, 2014, Plural photosensitive image detecting element arrays, Guangbin Zhang et al. / OmniVision Technologies, Inc. (Santa Clara, US)
An image sensor comprising:…

Charged Particle Energy Analysers and Methods of Operating Charged Particle Energy Analysers
US 08866103 B2, Oct. 21, 2014, With detector, Dane Cubric / Shimadzu Corporation (Kyoto, JP)
A charged particle energy analyser for simultaneous detection of charged…

Ion Detector
US 08866071 B2, Oct. 21, 2014, Ionic Separation or Analysis, Hiroshi Kobayashi et al. / Hamamatsu Photonics K.K. (Hamamatsu-shi, Shizuoka, JP)
An ion detector for detecting positive ions and negative ions, comprising:…

Extreme Ultraviolet Light Generation System
US 08698111 B2, April 15, 2014, Radiant Energy Generation and Sources, Osamu Wakabayashi et al. / Gigaphonton Inc. (Tochigi, JP)
An apparatus for generating extreme ultraviolet light by exciting a target…

Radiation Detector
US 08648311 B2, Feb. 11, 2014, Plural electric signalling means, Tatsuya Saito et al. / Canon Kabushiki Kaisha (Tokyo, JP)
A radiation detector comprising:…

High Dynamic Range Imager Circuit and Method for Reading High Dynamic Range Image
US 08575533 B2, Nov. 5, 2013, Plural photosensitive image detecting element arrays, Ching-Wei Chen et al. / Pixart Imaging Incorporation, R.O.C. (Hsin-Chu, TW)
A high dynamic range imager circuit, comprising:…

Charged Particle System for Reticle/Wafer Defects Inspection and Review
US 08519333 B2, Aug. 27, 2013, Electron probe type, Yi-Xiang Wang et al. / Hermes Microvision Inc. (Hsinchu, TW)
An aimed-up charged particle beam system, comprising:…

Optical Element, Imaging Optical System, and Camera Module
US 08455810 B2, June 4, 2013, Special photocell, Ryoko Tomioka et al. / FUJIFILM Corporation (Tokyo, JP)
An optical element incorporated into an imaging optical system, comprising:…

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