Featured patents

System and Method for a High Dynamic Range Sensitive Sensor Element or Array
US 08853611 B2, Oct. 7, 2014, Plural photosensitive image detecting element arrays, Sorin Davidovici / RJS Technology, Inc. (Hollis, US)
A method for obtaining a high dynamic range read-out signal from a pixel…

Charged Particle Beam Writing Apparatus and Charged Particle Beam Writing Method
US 08791422 B2, July 29, 2014, With Charged Particle Beam Deflection or Focussing, Takanao Touya et al. / Nuflare Technology, Inc. (Shizuoka, JP)
A charged particle beam writing apparatus comprising:…

Wavefront Measuring Apparatus, Wavefront Measuring Method, and Computer-Readable Medium Storing Program
US 08859977 B2, Oct. 14, 2014, Imaging system, Takeshi Kondoh / Canon Kabushiki Kaisha (Tokyo, JP)
A wavefront measuring apparatus comprising:…

Surface Inspection Apparatus and Method Thereof
US 08729514 B2, May 20, 2014, With camera or plural detectors, Minori Noguchi et al. / Hitachi High-Technologies Corporaation (Tokyo, JP)
A defect inspection apparatus comprising:…

Electrostatic Corrector
US 08723134 B2, May 13, 2014, With Charged Particle Beam Deflection or Focussing, Roland Janzen / ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH (Heimstetten, DE)
A correction device for a charged particle beam device for correcting aberrations…

Mask Inspection Apparatus and Mask Inspection Method
US 08669522 B2, March 11, 2014, Electron Energy Analysis, Hiroyuki Kashiwagi et al. / Kabushiki Kaisha Toshiba (Tokyo, JP)
A mask inspection apparatus comprising:…

Particle Beam System
US 08598525 B2, Dec. 3, 2013, Electron probe type, Thomas Kemen et al. / Carl Zeiss Microscopy GmbH (Jena, DE)
Particle beam system, comprising:…

Apparatus and System for Inspecting an Asset
US 08575562 B2, Nov. 5, 2013, With radiant energy source, Michael Wuestenbecker / General Electric Company (Schenectady, US)
An apparatus for inspecting an asset, the apparatus comprising:…

Laser Light Detection Circuit
US 08541733 B2, Sept. 24, 2013, Amplifier type, Takahiro Kawashima et al. / ON Semiconductor Trading, Ltd. (Hamilton, BM)
A laser light detection circuit comprising:…

Optical Sensor System on a Device for the Treatment of Liquids
US 08507886 B2, Aug. 13, 2013, Sample holder or supply, Helmut Knofe et al. / Eppendorf AG (Hamburg, DE)
An optical sensor system on a device for the treatment of liquids comprising:…

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