Featured patents

Electron Beam Device Including a First Electron Biprism to Split an Electron Beam Into Two Beams and a Second Electron Biprism in the Image Forming Lens System to Superpose the Two Beams
US 08772715 B2, July 8, 2014, Electron microscope type, Ken Harada et al. / Hitachi, Ltd. (Tokyo, JP)
An electron beam device comprising:…

Optical Gas Sensor Device and Method for Determining the Concentration of a Gas
US 08772723 B2, July 8, 2014, With gaseous sample, Frank Schaefer / Robert Bosch GmbH (Stuttgart, DE)
A gas sensor device for determining a concentration of a gas to be detected…

UV Curing System With Remote Controller
US 08748829 B2, June 10, 2014, Ultraviolet light source, Ronald Lipson
An ultraviolet curing system, comprising:…

Feedback Loop for Emitter Flashing
US 08674300 B2, March 18, 2014, Methods, Pavel Adamec / ICT Integrated Circuit Testing Gesellschaft fur Halbleiterprüftechnik mbH (Heimstetten, DE)
A method for stabilizing the emission current of an emitter of a charged particle…

Method for Operating a Particle Therapy System
US 08637839 B2, Jan. 28, 2014, Ion or electron beam irradiation, Martin Bräuer / Siemens Aktiengesellschaft (München, DE)
A method for operating a particle therapy system, the method comprising:…

Mass Distribution Measuring Method and Mass Distribution Measuring Apparatus
US 08637808 B2, Jan. 28, 2014, Ionic Separation or Analysis, Masafumi Kyogaku et al. / Canon Kabushiki Kaisha (Tokyo, JP)
A mass distribution measuring method of irradiating an ionizing beam toward…

Methods for Direct Biomolecule Identification by Matrix-Assisted Laser Desorption Ionization (MALDI) Mass Spectrometry
US 08525104 B2, Sept. 3, 2013, Ionic Separation or Analysis, Paul Pevsner et al. / New York University (New York, US)
A method for analyzing the biological molecule content of a tissue sample…

Method and Apparatus for Charged Particle Beam Inspection
US 08497475 B2, July 30, 2013, Inspection of Solids or Liquids by Charged Particles, Shih-Tsuan Chang et al. / Hermes-Microvision, Inc. (Hsinchu, TW)
A method for imaging and inspecting a sample using a charged particle beam, said…

Method, System and Apparatus for Filtering Ions in a Mass Spectrometer
US 08481926 B2, July 9, 2013, With time-of-flight indicator, Alexandre Loboda / DH Technologies Development Pte. Ltd. (Singapore, SG)
A method for filtering ions in a mass spectrometer, said mass spectrometer…

Radiotherapy Apparatus Control Method and Radiotherapy Apparatus Control Apparatus
US 08471222 B2, June 25, 2013, Means to Align or Position an Object Relative to a Source or Detector, Shuji Kaneko et al. / Mitsubishi Heavy Industries, Ltd. (Tokyo, JP)
A radiotherapy apparatus control method comprising:…

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