Featured patents

Device for Ambient Light Compensation for Optical Sensors Exposed to Both Useful Light and Ambient Light
US 08822901 B2, Sept. 2, 2014, Ambient light responsive, Wolfram Budde et al. / ELMOS Semiconductor AG (Dortmund, DE)
A device for effecting an ambient-light-compensated useful signal for use…

Radiographic Image Detecting Apparatus and Radiographic Image Capturing System
US 08872118 B2, Oct. 28, 2014, X-ray or gamma-ray system, Naoto Iwakiri et al. / FUJIFILM Corporation (Tokyo, JP)
A radiographic image detecting apparatus comprising:…

Method for Transmitting Ions and Carrier Gas Between Mutually Facing Curved Electrodes
US 08859960 B2, Oct. 14, 2014, Cyclically varying ion selecting field means, Satendra Prasad et al. / Thermo Finnigan LLC (San Jose, US)
A method for transmitting ions entrained in a flowing carrier gas…

Infrared Acid Detector and Method
US 08779362 B1, July 15, 2014, With gaseous sample, Ted J. Amundsen et al.
A method of detecting at least one of inorganic acid and organic acid in a vapor…

Coordinate Measuring Device
US 08772719 B2, July 8, 2014, Infrared responsive, Burkhard Böckem et al. / Leica Geosystems AG (Heerbrugg, CH)
A coordinate measurement apparatus, comprising:…

Radiation Detection With Optical Amplification
US 08674312 B2, March 18, 2014, Plural electric signalling means, Mark Andreaco et al. / Siemens Medical Solutions USA, Inc. (Malvern, US)
A device for detecting ionizing radiation, the device comprising:…

Die Bonding Process Incorporating Infrared Vision System
US 08633441 B2, Jan. 21, 2014, With radiation source, Ran Shi Wang et al. / ASM Assembly Automation Ltd (Hong Kong, HK)
A method of inspecting an alignment of a die relative to a substrate…

Fixed Connection Assembly for an RF Drive Circuit in a Mass Spectrometer
US 08575545 B2, Nov. 5, 2013, Cyclically varying ion selecting field means, Urs Steiner et al. / Bruker Daltonics, Inc. (Billerica, US)
A method for delivering RF signals from an RF drive circuit to a quadrupole…

Saliva Assay Technique for Heavy Metal
US 08502136 B2, Aug. 6, 2013, Methods, David Schneider
A method for determining heavy metal loading in a subject comprising:…

Method and Apparatus for Modulating Wafer Treatment Profile in UV Chamber
US 08455849 B2, June 4, 2013, Ultraviolet or infrared source, Sanjeev Baluja et al. / Applied Materials, Inc. (Santa Clara, US)
A substrate processing tool, comprising:…

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